P

Inventor

DEBROSSE JOHN K

US73 patents
⚠️ This page may combine multiple inventors who share the name “DEBROSSE JOHN K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

45 patents
US6982902B2Jan 3, 2006

MRAM array having a segmented bit line

IBM149 citations99
US5606188AFeb 25, 1997

Fabrication process and structure for a contacted-body silicon-on-insulator dynamic random access memory

IBM253 citations99
US6704230B1Mar 9, 2004

Error detection and correction method and apparatus in a magnetoresistive random access memory

IBM126 citations98
US6282113B1Aug 28, 2001

Four F-squared gapless dual layer bitline DRAM array architecture

IBM127 citations98
US5508219AApr 16, 1996

SOI DRAM with field-shield isolation and body contact

IBM108 citations98
US5360758ANov 1, 1994

Self-aligned buried strap for trench type DRAM cells

IBM109 citations98
US6816403B1Nov 9, 2004

Capacitively coupled sensing apparatus and method for cross point magnetic random access memory devices

IBM61 citations96
US5614431AMar 25, 1997

Method of making buried strap trench cell yielding an extended transistor

IBM52 citations96
US5534732AJul 9, 1996

Single twist layout and method for paired line conductors of integrated circuits

IBM73 citations95
US4873205AOct 10, 1989

Method for providing silicide bridge contact between silicon regions separated by a thin dielectric

IBM111 citations94
US8009453B2Aug 30, 2011

High density planar magnetic domain wall memory apparatus

IBM15 citations93
US7514271B2Apr 7, 2009

Method of forming high density planar magnetic domain wall memory

IBM36 citations93
US6351019B1Feb 26, 2002

Planarized and fill biased integrated circuit chip

IBM36 citations93
US6191988B1Feb 20, 2001

Floating bitline timer allowing a shared equalizer DRAM sense amplifier

IBM22 citations93
US6121078ASep 19, 2000

Integrated circuit planarization and fill biasing design method

IBM27 citations93
US5963489AOct 5, 1999

Method and apparatus for redundancy word line replacement in a repairable semiconductor memory device

IBM43 citations93
US5610867AMar 11, 1997

DRAM signal margin test method

IBM32 citations93
US5602051AFeb 11, 1997

Method of making stacked electrical device having regions of electrical isolation and electrical connection on a given stack level

IBM30 citations93
US5525531AJun 11, 1996

SOI DRAM with field-shield isolation

IBM54 citations93
US7535783B2May 19, 2009

Apparatus and method for implementing precise sensing of PCRAM devices

IBM32 citations92
US7239537B2Jul 3, 2007

Method and apparatus for current sense amplifier calibration in MRAM devices

IBM29 citations92
US10115450B1Oct 30, 2018

Cascode complimentary dual level shifter

IBM10 citations84
US9875780B1Jan 23, 2018

STT MRAM source line configuration

IBM14 citations84
US9786343B1Oct 10, 2017

STT MRAM common source line array bias scheme

IBM9 citations84
US9496018B2Nov 15, 2016

Nonvolatile memory interface for metadata shadowing

IBM8 citations84
US9373783B1Jun 21, 2016

Spin torque transfer MRAM device formed on silicon stud grown by selective epitaxy

IBM13 citations84
US9343131B1May 17, 2016

Mismatch and noise insensitive sense amplifier circuit for STT MRAM

IBM9 citations84
US8835256B1Sep 16, 2014

Memory array with self-aligned epitaxially grown memory elements and annular FET

IBM9 citations84
US8023305B2Sep 20, 2011

High density planar magnetic domain wall memory apparatus

IBM11 citations84
US7596045B2Sep 29, 2009

Design structure for initializing reference cells of a toggle switched MRAM device

IBM12 citations84
US7102916B2Sep 5, 2006

Method and structure for selecting anisotropy axis angle of MRAM device for reduced power consumption

IBM8 citations74
US6285612B1Sep 4, 2001

Reduced bit line equalization level sensing scheme

IBM12 citations74
US5874758AFeb 23, 1999

Buried strap trench cell yielding an extended transistor

IBM13 citations74
US5559739ASep 24, 1996

Dynamic random access memory with a simple test arrangement

IBM9 citations74
US10374152B2Aug 6, 2019

Magnetic tunnel junction based anti-fuses with cascoded transistors

IBM2 citations73
US10229722B2Mar 12, 2019

Three terminal spin hall MRAM

IBM3 citations73
US9852784B2Dec 26, 2017

Bit line clamp voltage generator for STT MRAM sensing

IBM3 citations73
US9799386B1Oct 24, 2017

STT MRAM midpoint reference cell allowing full write

IBM2 citations73
US9666258B2May 30, 2017

Bit line clamp voltage generator for STT MRAM sensing

IBM2 citations73
US9613674B2Apr 4, 2017

Mismatch and noise insensitive sense amplifier circuit for STT MRAM

IBM4 citations73
US9536926B1Jan 3, 2017

Magnetic tunnel junction based anti-fuses with cascoded transistors

IBM2 citations73
US9450179B2Sep 20, 2016

Spin torque transfer MRAM device formed on silicon stud grown by selective epitaxy

IBM3 citations73
US9378795B1Jun 28, 2016

Mismatch and noise insensitive sense amplifier circuit for STT MRAM

IBM4 citations73
US9355700B2May 31, 2016

Read circuit for memory

IBM3 citations73
US8828743B1Sep 9, 2014

Structure and fabrication of memory array with epitaxially grown memory elements and line-space patterns

IBM5 citations73

DEBROSSE JOHN K

2 patents

TOSHIBA KK

1 patent

GLOBALFOUNDRIES INC

1 patent

INFINEON TECHNOLOGIES AG

1 patent

Showing the top 50 of 73 patents by PatentIndex Score.