Inventor
DEBROSSE JOHN K
US73 patents
⚠️ This page may combine multiple inventors who share the name “DEBROSSE JOHN K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
45 patentsUS6982902B2Jan 3, 2006
MRAM array having a segmented bit line
IBM149 citations99
US5606188AFeb 25, 1997
Fabrication process and structure for a contacted-body silicon-on-insulator dynamic random access memory
IBM253 citations99
US6704230B1Mar 9, 2004
Error detection and correction method and apparatus in a magnetoresistive random access memory
IBM126 citations98
US6282113B1Aug 28, 2001
Four F-squared gapless dual layer bitline DRAM array architecture
IBM127 citations98
US5508219AApr 16, 1996
SOI DRAM with field-shield isolation and body contact
IBM108 citations98
US5360758ANov 1, 1994
Self-aligned buried strap for trench type DRAM cells
IBM109 citations98
US6816403B1Nov 9, 2004
Capacitively coupled sensing apparatus and method for cross point magnetic random access memory devices
IBM61 citations96
US5614431AMar 25, 1997
Method of making buried strap trench cell yielding an extended transistor
IBM52 citations96
US5534732AJul 9, 1996
Single twist layout and method for paired line conductors of integrated circuits
IBM73 citations95
US4873205AOct 10, 1989
Method for providing silicide bridge contact between silicon regions separated by a thin dielectric
IBM111 citations94
US8009453B2Aug 30, 2011
High density planar magnetic domain wall memory apparatus
IBM15 citations93
US7514271B2Apr 7, 2009
Method of forming high density planar magnetic domain wall memory
IBM36 citations93
US6351019B1Feb 26, 2002
Planarized and fill biased integrated circuit chip
IBM36 citations93
US6191988B1Feb 20, 2001
Floating bitline timer allowing a shared equalizer DRAM sense amplifier
IBM22 citations93
US6121078ASep 19, 2000
Integrated circuit planarization and fill biasing design method
IBM27 citations93
US5963489AOct 5, 1999
Method and apparatus for redundancy word line replacement in a repairable semiconductor memory device
IBM43 citations93
US5610867AMar 11, 1997
DRAM signal margin test method
IBM32 citations93
US5602051AFeb 11, 1997
Method of making stacked electrical device having regions of electrical isolation and electrical connection on a given stack level
IBM30 citations93
US5525531AJun 11, 1996
SOI DRAM with field-shield isolation
IBM54 citations93
US7535783B2May 19, 2009
Apparatus and method for implementing precise sensing of PCRAM devices
IBM32 citations92
US7239537B2Jul 3, 2007
Method and apparatus for current sense amplifier calibration in MRAM devices
IBM29 citations92
US10115450B1Oct 30, 2018
Cascode complimentary dual level shifter
IBM10 citations84
US9875780B1Jan 23, 2018
STT MRAM source line configuration
IBM14 citations84
US9786343B1Oct 10, 2017
STT MRAM common source line array bias scheme
IBM9 citations84
US9496018B2Nov 15, 2016
Nonvolatile memory interface for metadata shadowing
IBM8 citations84
US9373783B1Jun 21, 2016
Spin torque transfer MRAM device formed on silicon stud grown by selective epitaxy
IBM13 citations84
US9343131B1May 17, 2016
Mismatch and noise insensitive sense amplifier circuit for STT MRAM
IBM9 citations84
US8835256B1Sep 16, 2014
Memory array with self-aligned epitaxially grown memory elements and annular FET
IBM9 citations84
US8023305B2Sep 20, 2011
High density planar magnetic domain wall memory apparatus
IBM11 citations84
US7596045B2Sep 29, 2009
Design structure for initializing reference cells of a toggle switched MRAM device
IBM12 citations84
US7102916B2Sep 5, 2006
Method and structure for selecting anisotropy axis angle of MRAM device for reduced power consumption
IBM8 citations74
US6285612B1Sep 4, 2001
Reduced bit line equalization level sensing scheme
IBM12 citations74
US5874758AFeb 23, 1999
Buried strap trench cell yielding an extended transistor
IBM13 citations74
US5559739ASep 24, 1996
Dynamic random access memory with a simple test arrangement
IBM9 citations74
US10374152B2Aug 6, 2019
Magnetic tunnel junction based anti-fuses with cascoded transistors
IBM2 citations73
US10229722B2Mar 12, 2019
Three terminal spin hall MRAM
IBM3 citations73
US9852784B2Dec 26, 2017
Bit line clamp voltage generator for STT MRAM sensing
IBM3 citations73
US9799386B1Oct 24, 2017
STT MRAM midpoint reference cell allowing full write
IBM2 citations73
US9666258B2May 30, 2017
Bit line clamp voltage generator for STT MRAM sensing
IBM2 citations73
US9613674B2Apr 4, 2017
Mismatch and noise insensitive sense amplifier circuit for STT MRAM
IBM4 citations73
US9536926B1Jan 3, 2017
Magnetic tunnel junction based anti-fuses with cascoded transistors
IBM2 citations73
US9450179B2Sep 20, 2016
Spin torque transfer MRAM device formed on silicon stud grown by selective epitaxy
IBM3 citations73
US9378795B1Jun 28, 2016
Mismatch and noise insensitive sense amplifier circuit for STT MRAM
IBM4 citations73
US9355700B2May 31, 2016
Read circuit for memory
IBM3 citations73
US8828743B1Sep 9, 2014
Structure and fabrication of memory array with epitaxially grown memory elements and line-space patterns
IBM5 citations73
DEBROSSE JOHN K
2 patentsTOSHIBA KK
1 patentGLOBALFOUNDRIES INC
1 patentINFINEON TECHNOLOGIES AG
1 patentShowing the top 50 of 73 patents by PatentIndex Score.