Inventor
KO YOUNG-GUN
KR28 patents
⚠️ This page may combine multiple inventors who share the name “KO YOUNG-GUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
23 patentsUS6498370B1Dec 24, 2002
SOI semiconductor integrated circuit for eliminating floating body effects in SOI MOSFETs and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD87 citations98
US7569456B2Aug 4, 2009
MOS transistor with elevated source and drain structures and method of fabrication thereof
SAMSUNG ELECTRONICS CO LTD109 citations97
US6521959B2Feb 18, 2003
SOI semiconductor integrated circuit for eliminating floating body effects in SOI MOSFETs and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD85 citations97
US6407429B1Jun 18, 2002
Semiconductor device having silicon on insulator and fabricating method therefor
SAMSUNG ELECTRONICS CO LTD45 citations96
US6693325B1Feb 17, 2004
Semiconductor device having silicon on insulator and fabricating method therefor
SAMSUNG ELECTRONICS CO LTD22 citations93
US7227224B2Jun 5, 2007
MOS transistor with elevated source and drain structures and method of fabrication thereof
SAMSUNG ELECTRONICS CO LTD21 citations92
US7098514B2Aug 29, 2006
Highly integrated semiconductor device with silicide layer that secures contact margin and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD19 citations92
US6770540B2Aug 3, 2004
Method of fabricating semiconductor device having L-shaped spacer
SAMSUNG ELECTRONICS CO LTD20 citations92
US6693013B2Feb 17, 2004
Semiconductor transistor using L-shaped spacer and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD29 citations92
US6869839B2Mar 22, 2005
Method of fabricating a semiconductor device having an L-shaped spacer
SAMSUNG ELECTRONICS CO LTD16 citations84
US9209177B2Dec 8, 2015
Semiconductor devices including gates and dummy gates of different materials
SAMSUNG ELECTRONICS CO LTD9 citations83
US6858907B2Feb 22, 2005
Method of fabricating semiconductor device having notched gate
SAMSUNG ELECTRONICS CO LTD14 citations83
US10141312B2Nov 27, 2018
Semiconductor devices including insulating materials in fins
SAMSUNG ELECTRONICS CO LTD16 citations82
US7338874B2Mar 4, 2008
Highly integrated semiconductor device with silicide layer that secures contact margin and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD8 citations74
US7052965B2May 30, 2006
Methods of fabricating MOS field effect transistors with pocket regions using implant blocking patterns
SAMSUNG ELECTRONICS CO LTD9 citations74
US6917085B2Jul 12, 2005
Semiconductor transistor using L-shaped spacer
SAMSUNG ELECTRONICS CO LTD7 citations74
US6844223B2Jan 18, 2005
Semiconductor device having silicon on insulator and fabricating method therefor
SAMSUNG ELECTRONICS CO LTD7 citations74
US6706569B2Mar 16, 2004
SOI semiconductor integrated circuit for eliminating floating body effects in SOI MOSFETs and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD10 citations74
US6703280B2Mar 9, 2004
SOI semiconductor integrated circuit for eliminating floating body effects in SOI MOSFETs and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD8 citations74
US6689648B2Feb 10, 2004
Semiconductor device having silicon on insulator and fabricating method therefor
SAMSUNG ELECTRONICS CO LTD11 citations74
US7618868B2Nov 17, 2009
Method of manufacturing field effect transistors using sacrificial blocking layers
SAMSUNG ELECTRONICS CO LTD3 citations62
US7576407B2Aug 18, 2009
Devices and methods for constructing electrically programmable integrated fuses for low power applications
SAMSUNG ELECTRONICS CO LTD4 citations59
US7541234B2Jun 2, 2009
Methods of fabricating integrated circuit transistors by simultaneously removing a photoresist layer and a carbon-containing layer on different active areas
SAMSUNG ELECTRONICS CO LTD0 citations41
MAEDA SHIGENOBU
3 patentsUS9240481B2Jan 19, 2016
Semiconductor device having embedded strain-inducing pattern
MAEDA SHIGENOBU8 citations83
US8962435B2Feb 24, 2015
Method of forming semiconductor device having embedded strain-inducing pattern
MAEDA SHIGENOBU5 citations83
US8884298B2Nov 11, 2014
Semiconductor device having embedded strain-inducing pattern and method of forming the same
MAEDA SHIGENOBU11 citations83