Inventor
LITMAN ALON
IL32 patents
⚠️ This page may combine multiple inventors who share the name “LITMAN ALON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
26 patentsUS7468506B2Dec 23, 2008
Spot grid array scanning system
APPLIED MATERIALS ISRAEL LTD55 citations96
US7285779B2Oct 23, 2007
Methods of scanning an object that includes multiple regions of interest using an array of scanning beams
APPLIED MATERIALS ISRAEL LTD30 citations92
US7468507B2Dec 23, 2008
Optical spot grid array scanning system
APPLIED MATERIALS ISRAEL LTD37 citations91
US9818577B2Nov 14, 2017
Multi mode system with a dispersion X-ray detector
APPLIED MATERIALS ISRAEL LTD7 citations83
US9666412B1May 30, 2017
Method for charging and imaging an object
APPLIED MATERIALS ISRAEL LTD18 citations83
US7521700B2Apr 21, 2009
Raster frame beam system for electron beam lithography
APPLIED MATERIALS ISRAEL LTD10 citations83
US10903044B1Jan 26, 2021
Filling empty structures with deposition under high-energy SEM for uniform DE layering
APPLIED MATERIALS ISRAEL LTD8 citations82
US10211026B2Feb 19, 2019
Retractable detector
APPLIED MATERIALS ISRAEL LTD1 citations72
US7842935B2Nov 30, 2010
Raster frame beam system for electron beam lithography
APPLIED MATERIALS ISRAEL LTD7 citations72
US11366072B2Jun 21, 2022
Detecting backscattered electrons in a multibeam charged particle column
APPLIED MATERIALS ISRAEL LTD4 citations71
US9632044B1Apr 25, 2017
Imaging bottom of high aspect ratio holes
APPLIED MATERIALS ISRAEL LTD2 citations71
US9466462B2Oct 11, 2016
Inspection of regions of interest using an electron beam system
APPLIED MATERIALS ISRAEL LTD2 citations62
US6914443B2Jul 5, 2005
Apparatus and method for enhanced voltage contrast analysis
APPLIED MATERIALS ISRAEL LTD4 citations62
US11264202B2Mar 1, 2022
Generating three dimensional information regarding structural elements of a specimen
APPLIED MATERIALS ISRAEL LTD1 citations58
US11315754B2Apr 26, 2022
Adaptive geometry for optimal focused ion beam etching
APPLIED MATERIALS ISRAEL LTD0 citations54
US11501951B1Nov 15, 2022
X-ray imaging in cross-section using un-cut lamella with background material
APPLIED MATERIALS ISRAEL LTD0 citations51
US10714305B2Jul 14, 2020
Retractable detector
APPLIED MATERIALS ISRAEL LTD0 citations51
US10156785B2Dec 18, 2018
Inspection of a lithographic mask that is protected by a pellicle
APPLIED MATERIALS ISRAEL LTD0 citations50
US9448253B2Sep 20, 2016
Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement device
APPLIED MATERIALS ISRAEL LTD0 citations50
US9366954B2Jun 14, 2016
Inspection of a lithographic mask that is protected by a pellicle
APPLIED MATERIALS ISRAEL LTD0 citations50
US10074513B2Sep 11, 2018
Multi mode systems with retractable detectors
APPLIED MATERIALS ISRAEL LTD1 citations47
US9847209B2Dec 19, 2017
Inspection of regions of interest using an electron beam system
APPLIED MATERIALS ISRAEL LTD0 citations41
US9297692B2Mar 29, 2016
System and method for inspecting a sample using landing lens
APPLIED MATERIALS ISRAEL LTD0 citations41
US9958501B1May 1, 2018
System for electrical measurements of objects in a vacuumed environment
APPLIED MATERIALS ISRAEL LTD0 citations40
US9470751B2Oct 18, 2016
Detecting open and short of conductors
APPLIED MATERIALS ISRAEL LTD0 citations40
US10541104B2Jan 21, 2020
System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection
APPLIED MATERIALS ISRAEL LTD0 citations31
OPAL TECHNOLOGIES LTD
2 patentsUS5644132AJul 1, 1997
System for high resolution imaging and measurement of topographic and material features on a specimen
OPAL TECHNOLOGIES LTD107 citations95
US5466940ANov 14, 1995
Electron detector with high backscattered electron acceptance for particle beam apparatus
OPAL TECHNOLOGIES LTD55 citations94