Inventor
CHIRKO KONSTANTIN
IL9 patents
⚠️ This page may combine multiple inventors who share the name “CHIRKO KONSTANTIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
8 patentsUS10903044B1Jan 26, 2021
Filling empty structures with deposition under high-energy SEM for uniform DE layering
APPLIED MATERIALS ISRAEL LTD8 citations82
US9632044B1Apr 25, 2017
Imaging bottom of high aspect ratio holes
APPLIED MATERIALS ISRAEL LTD2 citations71
US11264202B2Mar 1, 2022
Generating three dimensional information regarding structural elements of a specimen
APPLIED MATERIALS ISRAEL LTD1 citations58
US9448253B2Sep 20, 2016
Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement device
APPLIED MATERIALS ISRAEL LTD0 citations50
US12456600B2Oct 28, 2025
Scanning electron microscopy-based tomography of specimens
APPLIED MATERIALS ISRAEL LTD0 citations45
US11921063B2Mar 5, 2024
Lateral recess measurement in a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations44
US11953316B2Apr 9, 2024
Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination angles
APPLIED MATERIALS ISRAEL LTD0 citations42
US10714306B2Jul 14, 2020
Measuring a height profile of a hole formed in non-conductive region
APPLIED MATERIALS ISRAEL LTD0 citations29