Inventor

RIJPERS BARTOLOMEUS PETRUS

NL6 patents

⚠️ This page may combine multiple inventors who share the name “RIJPERS BARTOLOMEUS PETRUS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASML NETHERLANDS BV

3 patents

US7629697B2Dec 8, 2009

Marker structure and method for controlling alignment of layers of a multi-layered substrate

ASML NETHERLANDS BV10 citations83

US10416577B2Sep 17, 2019

Position measuring method of an alignment target

ASML NETHERLANDS BV3 citations69

US11106144B2Aug 31, 2021

Lithographic method and apparatus

ASML NETHERLANDS BV0 citations45

VAN HAREN RICHARD JOHANNES FRANCISCUS

2 patents

US8722179B2May 13, 2014

Substrate comprising a mark

VAN HAREN RICHARD JOHANNES FRANCISCUS2 citations57

US8609441B2Dec 17, 2013

Substrate comprising a mark

VAN HAREN RICHARD JOHANNES FRANCISCUS2 citations57

RIJPERS BARTOLOMEUS PETRUS

1 patent

US9116086B2Aug 25, 2015

Deposition method and apparatus

RIJPERS BARTOLOMEUS PETRUS0 citations22