Inventor
DURAND DE GEVIGNEY MAYEUL
FR7 patents
Patents
7 patentsUS9857313B2Jan 2, 2018
Method and system for inspecting wafers for electronics, optics or optoelectronics
UNITY SEMICONDUCTOR2 citations69
US12074400B1Aug 27, 2024
Substrate dimension adapter
UNITY SEMICONDUCTOR3 citations66
US10260868B2Apr 16, 2019
Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics
UNITY SEMICONDUCTOR1 citations59
US11965834B2Apr 23, 2024
Dark-field optical inspection device
UNITY SEMICONDUCTOR0 citations47
US11300520B2Apr 12, 2022
Method and system for optically inspecting a substrate
UNITY SEMICONDUCTOR0 citations47
US12163899B2Dec 10, 2024
System for optical inspection of a substrate using same or different wavelengths
UNITY SEMICONDUCTOR0 citations42
US11092644B2Aug 17, 2021
Method and system for inspecting boards for microelectronics or optics by laser doppler effect
UNITY SEMICONDUCTOR0 citations42