Inventor
GASTALDO PHILIPPE
FR17 patents
⚠️ This page may combine multiple inventors who share the name “GASTALDO PHILIPPE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITY SEMICONDUCTOR
4 patentsUS10082425B2Sep 25, 2018
Integrated chromatic confocal sensor
UNITY SEMICONDUCTOR6 citations82
US9857313B2Jan 2, 2018
Method and system for inspecting wafers for electronics, optics or optoelectronics
UNITY SEMICONDUCTOR2 citations69
US10260868B2Apr 16, 2019
Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics
UNITY SEMICONDUCTOR1 citations59
US11092644B2Aug 17, 2021
Method and system for inspecting boards for microelectronics or optics by laser doppler effect
UNITY SEMICONDUCTOR0 citations42
FOGALE NANOTECH
3 patentsUS9739600B1Aug 22, 2017
Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer
FOGALE NANOTECH33 citations92
US9494529B1Nov 15, 2016
Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolution
FOGALE NANOTECH22 citations91
US10240977B2Mar 26, 2019
Method for 2D/3D inspection of an object such as a wafer
FOGALE NANOTECH1 citations61
GASTALDO PHILIPPE
3 patentsUS8654324B2Feb 18, 2014
Device and method for inspecting semiconductor wafers
GASTALDO PHILIPPE5 citations70
US8817249B2Aug 26, 2014
Device and method for inspecting moving semiconductor wafers
GASTALDO PHILIPPE3 citations55
US9007456B2Apr 14, 2015
Device and method for inspecting semiconductor wafers
GASTALDO PHILIPPE2 citations52