Inventor

FIGUEIRO THIAGO

FR8 patents

⚠️ This page may combine multiple inventors who share the name “FIGUEIRO THIAGO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASELTA NANOGRAPHICS

6 patents

US10295912B2May 21, 2019

Method for determining the parameters of an IC manufacturing process model

ASELTA NANOGRAPHICS2 citations68

US10578978B2Mar 3, 2020

Method for determining the dose corrections to be applied to an IC manufacturing process by a matching procedure

ASELTA NANOGRAPHICS1 citations56

US10553394B2Feb 4, 2020

Method for the correction of electron proximity effects

ASELTA NANOGRAPHICS1 citations54

US10156796B2Dec 18, 2018

Method for determining the parameters of an IC manufacturing process by a differential procedure

ASELTA NANOGRAPHICS1 citations45

US10522328B2Dec 31, 2019

Method of performing dose modulation, in particular for electron beam lithography

ASELTA NANOGRAPHICS0 citations37

US9934336B2Apr 3, 2018

Method of correcting electron proximity effects using Voigt type scattering functions

ASELTA NANOGRAPHICS0 citations36

SCHIAVONE PATRICK

1 patent

US9224577B2Dec 29, 2015

Method for correcting electronic proximity effects using off-center scattering functions

SCHIAVONE PATRICK1 citations45

COMMISSARIAT ENERGIE ATOMIQUE

1 patent

US10423074B2Sep 24, 2019

Method for calculating the metrics of an IC manufacturing process

COMMISSARIAT ENERGIE ATOMIQUE0 citations32