Inventor
KOO BON-WOONG
US79 patents
⚠️ This page may combine multiple inventors who share the name “KOO BON-WOONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VARIAN SEMICONDUCTOR EQUIPMENT
20 patentsUS7126808B2Oct 24, 2006
Wafer platen equipped with electrostatic clamp, wafer backside gas cooling, and high voltage operation capability for plasma doping
VARIAN SEMICONDUCTOR EQUIPMENT69 citations95
US9230773B1Jan 5, 2016
Ion beam uniformity control
VARIAN SEMICONDUCTOR EQUIPMENT20 citations92
US7453059B2Nov 18, 2008
Technique for monitoring and controlling a plasma process
VARIAN SEMICONDUCTOR EQUIPMENT21 citations91
US7132672B2Nov 7, 2006
Faraday dose and uniformity monitor for plasma based ion implantation
VARIAN SEMICONDUCTOR EQUIPMENT21 citations90
US9288889B2Mar 15, 2016
Apparatus and techniques for energetic neutral beam processing
VARIAN SEMICONDUCTOR EQUIPMENT7 citations84
US8357912B2Jan 22, 2013
Techniques for providing a multimode ion source
VARIAN SEMICONDUCTOR EQUIPMENT6 citations84
US7700925B2Apr 20, 2010
Techniques for providing a multimode ion source
VARIAN SEMICONDUCTOR EQUIPMENT11 citations84
US7692139B2Apr 6, 2010
Techniques for commensurate cusp-field for effective ion beam neutralization
VARIAN SEMICONDUCTOR EQUIPMENT8 citations84
US9142379B2Sep 22, 2015
Ion source and a method for in-situ cleaning thereof
VARIAN SEMICONDUCTOR EQUIPMENT7 citations83
US7888662B2Feb 15, 2011
Ion source cleaning method and apparatus
VARIAN SEMICONDUCTOR EQUIPMENT9 citations83
US7476849B2Jan 13, 2009
Technique for monitoring and controlling a plasma process
VARIAN SEMICONDUCTOR EQUIPMENT10 citations83
US9093372B2Jul 28, 2015
Technique for processing a substrate
VARIAN SEMICONDUCTOR EQUIPMENT6 citations82
US9064795B2Jun 23, 2015
Technique for processing a substrate
VARIAN SEMICONDUCTOR EQUIPMENT8 citations82
US7878145B2Feb 1, 2011
Monitoring plasma ion implantation systems for fault detection and process control
VARIAN SEMICONDUCTOR EQUIPMENT7 citations80
US7675730B2Mar 9, 2010
Techniques for detecting wafer charging in a plasma processing system
VARIAN SEMICONDUCTOR EQUIPMENT8 citations79
US9232628B2Jan 5, 2016
Method and system for plasma-assisted ion beam processing
VARIAN SEMICONDUCTOR EQUIPMENT4 citations73
US9018829B2Apr 28, 2015
Excited gas injection for ion implant control
VARIAN SEMICONDUCTOR EQUIPMENT2 citations63
US8669538B1Mar 11, 2014
Method of improving ion beam quality in an implant system
VARIAN SEMICONDUCTOR EQUIPMENT3 citations62
US9034743B2May 19, 2015
Method for implant productivity enhancement
VARIAN SEMICONDUCTOR EQUIPMENT3 citations61
US7723707B2May 25, 2010
Techniques for plasma injection
VARIAN SEMICONDUCTOR EQUIPMENT2 citations60
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC
13 patentsUS9978554B1May 22, 2018
Dual cathode ion source
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC9 citations82
US9859098B2Jan 2, 2018
Temperature controlled ion source
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC5 citations81
US9899193B1Feb 20, 2018
RF ion source with dynamic volume control
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC8 citations79
US9922795B2Mar 20, 2018
High brightness ion beam extraction using bias electrodes and magnets proximate the extraction aperture
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC2 citations73
US10290466B2May 14, 2019
Boron implanting using a co-gas
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC1 citations72
US9865430B2Jan 9, 2018
Boron implanting using a co-gas
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC3 citations72
US9840772B2Dec 12, 2017
Method of improving ion beam quality in a non-mass-analyzed ion implantation system
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC2 citations72
US9677171B2Jun 13, 2017
Method of improving ion beam quality in a non-mass-analyzed ion implantation system
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC2 citations72
US10446372B2Oct 15, 2019
Dual cathode ion source
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC2 citations71
US9887067B2Feb 6, 2018
Boron implanting using a co-gas
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC2 citations71
US9524849B2Dec 20, 2016
Method of improving ion beam quality in an implant system
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC4 citations70
US11114277B2Sep 7, 2021
Dual cathode ion source
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations61
US11049691B2Jun 29, 2021
Ion beam quality control using a movable mass resolving device
VARIAN SEMICONDUCTOR EQUIPMENT ASS INC1 citations61
APPLIED MATERIALS INC
8 patentsUS10923306B2Feb 16, 2021
Ion source with biased extraction plate
APPLIED MATERIALS INC2 citations73
US11127557B1Sep 21, 2021
Ion source with single-slot tubular cathode
APPLIED MATERIALS INC5 citations72
US10748738B1Aug 18, 2020
Ion source with tubular cathode
APPLIED MATERIALS INC4 citations69
US11810746B2Nov 7, 2023
Variable thickness ion source extraction plate
APPLIED MATERIALS INC0 citations62
US11600473B2Mar 7, 2023
Ion source with biased extraction plate
APPLIED MATERIALS INC0 citations62
USD1051838SNov 19, 2024
Single-slot tubular cathode
APPLIED MATERIALS INC0 citations61
US11631567B2Apr 18, 2023
Ion source with single-slot tubular cathode
APPLIED MATERIALS INC0 citations61
US11562885B2Jan 24, 2023
Particle yield via beam-line pressure control
APPLIED MATERIALS INC0 citations59
KOO BON-WOONG
3 patentsBENVENISTE VICTOR
2 patentsGODET LUDOVIC
1 patentSINCLAIR FRANK
1 patentCHO JEONG-HA
1 patentRADOVANOV SVETLANA B
1 patentShowing the top 50 of 79 patents by PatentIndex Score.