Inventor

LIAO HSIANG-CHOU

TW4 patents

⚠️ This page may combine multiple inventors who share the name “LIAO HSIANG-CHOU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MACRONIX INT CO LTD

2 patents

US9589086B2Mar 7, 2017

Method for measuring and analyzing surface structure of chip or wafer

MACRONIX INT CO LTD5 citations71

US9244112B2Jan 26, 2016

Method for detecting an electrical defect of contact/via plugs

MACRONIX INT CO LTD1 citations50

HUNG CHE-LUN

1 patent

US8329480B2Dec 11, 2012

Test pattern for detecting piping in a memory array

HUNG CHE-LUN2 citations52

LIAO HSIANG-CHOU

1 patent

US8594963B2Nov 26, 2013

In-line inspection yield prediction system

LIAO HSIANG-CHOU1 citations43