Inventor
SENDELBACH MATTHEW
US15 patents
⚠️ This page may combine multiple inventors who share the name “SENDELBACH MATTHEW”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NOVA MEASURING INSTR LTD
5 patentsUS10209206B2Feb 19, 2019
Method and system for determining strain distribution in a sample
NOVA MEASURING INSTR LTD6 citations72
US10876959B2Dec 29, 2020
Method and system for optical characterization of patterned samples
NOVA MEASURING INSTR LTD2 citations70
US10302414B2May 28, 2019
Scatterometry method and system
NOVA MEASURING INSTR LTD2 citations65
US10916404B2Feb 9, 2021
TEM-based metrology method and system
NOVA MEASURING INSTR LTD0 citations58
US10222710B2Mar 5, 2019
Method and system for planning metrology measurements
NOVA MEASURING INSTR LTD0 citations37
NOVA LTD
4 patentsUS11885737B2Jan 30, 2024
Method and system for optical characterization of patterned samples
NOVA LTD1 citations59
US11710616B2Jul 25, 2023
TEM-based metrology method and system
NOVA LTD0 citations58
US11450541B2Sep 20, 2022
Metrology method and system
NOVA LTD1 citations58
US11309162B2Apr 19, 2022
TEM-based metrology method and system
NOVA LTD0 citations58