Inventor
GOEL NITI
US35 patents
⚠️ This page may combine multiple inventors who share the name “GOEL NITI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
25 patentsUS8026509B2Sep 27, 2011
Tunnel field effect transistor and method of manufacturing same
INTEL CORP16 citations92
US9570614B2Feb 14, 2017
Ge and III-V channel semiconductor devices having maximized compliance and free surface relaxation
INTEL CORP14 citations84
US9391181B2Jul 12, 2016
Lattice mismatched hetero-epitaxial film
INTEL CORP10 citations84
US8872225B2Oct 28, 2014
Defect transferred and lattice mismatched epitaxial film
INTEL CORP12 citations84
US9590069B2Mar 7, 2017
Self-aligned structures and methods for asymmetric GaN transistors and enhancement mode operation
INTEL CORP5 citations83
US10693008B2Jun 23, 2020
Cladding layer epitaxy via template engineering for heterogeneous integration on silicon
INTEL CORP6 citations73
US10249490B2Apr 2, 2019
Non-silicon device heterolayers on patterned silicon substrate for CMOS by combination of selective and conformal epitaxy
INTEL CORP2 citations73
US10181518B2Jan 15, 2019
Selective epitaxially grown III-V materials based devices
INTEL CORP3 citations73
US9899505B2Feb 20, 2018
Conductivity improvements for III-V semiconductor devices
INTEL CORP3 citations73
US9698013B2Jul 4, 2017
Methods and structures to prevent sidewall defects during selective epitaxy
INTEL CORP5 citations73
US9640622B2May 2, 2017
Selective epitaxially grown III-V materials based devices
INTEL CORP2 citations73
US9640537B2May 2, 2017
Non-silicon device heterolayers on patterned silicon substrate for CMOS by combination of selective and conformal epitaxy
INTEL CORP2 citations73
US9923087B2Mar 20, 2018
Self-aligned structures and methods for asymmetric GaN transistors and enhancement mode operation
INTEL CORP3 citations72
US10026686B2Jul 17, 2018
Decoupling capacitors and arrangements
INTEL CORP2 citations68
US9112028B2Aug 18, 2015
Methods of containing defects for non-silicon device engineering
INTEL CORP2 citations63
US10268122B2Apr 23, 2019
Techniques to achieve area reduction through co-optimizing logic core blocks and memory redundancies
INTEL CORP1 citations54
US10573717B2Feb 25, 2020
Selective epitaxially grown III-V materials based devices
INTEL CORP0 citations52
US10475706B2Nov 12, 2019
Making a defect free fin based device in lateral epitaxy overgrowth region
INTEL CORP0 citations52
US10096474B2Oct 9, 2018
Methods and structures to prevent sidewall defects during selective epitaxy
INTEL CORP1 citations52
US9905651B2Feb 27, 2018
GE and III-V channel semiconductor devices having maximized compliance and free surface relaxation
INTEL CORP0 citations52
US9865684B2Jan 9, 2018
Nanoscale structure with epitaxial film having a recessed bottom portion
INTEL CORP0 citations52
US9685381B2Jun 20, 2017
Integrating VLSI-compatible fin structures with selective epitaxial growth and fabricating devices thereon
INTEL CORP1 citations52
US9666583B2May 30, 2017
Methods of containing defects for non-silicon device engineering
INTEL CORP0 citations52
US9583396B2Feb 28, 2017
Making a defect free fin based device in lateral epitaxy overgrowth region
INTEL CORP0 citations52
US10217732B2Feb 26, 2019
Techniques for forming a compacted array of functional cells
INTEL CORP0 citations48
PILLARISETTY RAVI
3 patentsUS8765563B2Jul 1, 2014
Trench confined epitaxially grown device layer(s)
PILLARISETTY RAVI42 citations98
US9634007B2Apr 25, 2017
Trench confined epitaxially grown device layer(s)
PILLARISETTY RAVI16 citations93
US8710490B2Apr 29, 2014
Semiconductor device having germanium active layer with underlying parasitic leakage barrier layer
PILLARISETTY RAVI8 citations84
GOEL NITI
3 patentsUS8785907B2Jul 22, 2014
Epitaxial film growth on patterned substrate
GOEL NITI13 citations82
US8686402B2Apr 1, 2014
Tunnel field effect transistor and method of manufacturing same
GOEL NITI6 citations81
US8716751B2May 6, 2014
Methods of containing defects for non-silicon device engineering
GOEL NITI0 citations51
MUKHERJEE NILOY
2 patentsUS9653559B2May 16, 2017
Methods to enhance doping concentration in near-surface layers of semiconductors and methods of making same
MUKHERJEE NILOY1 citations51
US9711591B2Jul 18, 2017
Methods of forming hetero-layers with reduced surface roughness and bulk defect density of non-native surfaces and the structures formed thereby
MUKHERJEE NILOY1 citations49