P

Inventor

GOEL NITI

US35 patents
⚠️ This page may combine multiple inventors who share the name “GOEL NITI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

25 patents
US8026509B2Sep 27, 2011

Tunnel field effect transistor and method of manufacturing same

INTEL CORP16 citations92
US9570614B2Feb 14, 2017

Ge and III-V channel semiconductor devices having maximized compliance and free surface relaxation

INTEL CORP14 citations84
US9391181B2Jul 12, 2016

Lattice mismatched hetero-epitaxial film

INTEL CORP10 citations84
US8872225B2Oct 28, 2014

Defect transferred and lattice mismatched epitaxial film

INTEL CORP12 citations84
US9590069B2Mar 7, 2017

Self-aligned structures and methods for asymmetric GaN transistors and enhancement mode operation

INTEL CORP5 citations83
US10693008B2Jun 23, 2020

Cladding layer epitaxy via template engineering for heterogeneous integration on silicon

INTEL CORP6 citations73
US10249490B2Apr 2, 2019

Non-silicon device heterolayers on patterned silicon substrate for CMOS by combination of selective and conformal epitaxy

INTEL CORP2 citations73
US10181518B2Jan 15, 2019

Selective epitaxially grown III-V materials based devices

INTEL CORP3 citations73
US9899505B2Feb 20, 2018

Conductivity improvements for III-V semiconductor devices

INTEL CORP3 citations73
US9698013B2Jul 4, 2017

Methods and structures to prevent sidewall defects during selective epitaxy

INTEL CORP5 citations73
US9640622B2May 2, 2017

Selective epitaxially grown III-V materials based devices

INTEL CORP2 citations73
US9640537B2May 2, 2017

Non-silicon device heterolayers on patterned silicon substrate for CMOS by combination of selective and conformal epitaxy

INTEL CORP2 citations73
US9923087B2Mar 20, 2018

Self-aligned structures and methods for asymmetric GaN transistors and enhancement mode operation

INTEL CORP3 citations72
US10026686B2Jul 17, 2018

Decoupling capacitors and arrangements

INTEL CORP2 citations68
US9112028B2Aug 18, 2015

Methods of containing defects for non-silicon device engineering

INTEL CORP2 citations63
US10268122B2Apr 23, 2019

Techniques to achieve area reduction through co-optimizing logic core blocks and memory redundancies

INTEL CORP1 citations54
US10573717B2Feb 25, 2020

Selective epitaxially grown III-V materials based devices

INTEL CORP0 citations52
US10475706B2Nov 12, 2019

Making a defect free fin based device in lateral epitaxy overgrowth region

INTEL CORP0 citations52
US10096474B2Oct 9, 2018

Methods and structures to prevent sidewall defects during selective epitaxy

INTEL CORP1 citations52
US9905651B2Feb 27, 2018

GE and III-V channel semiconductor devices having maximized compliance and free surface relaxation

INTEL CORP0 citations52
US9865684B2Jan 9, 2018

Nanoscale structure with epitaxial film having a recessed bottom portion

INTEL CORP0 citations52
US9685381B2Jun 20, 2017

Integrating VLSI-compatible fin structures with selective epitaxial growth and fabricating devices thereon

INTEL CORP1 citations52
US9666583B2May 30, 2017

Methods of containing defects for non-silicon device engineering

INTEL CORP0 citations52
US9583396B2Feb 28, 2017

Making a defect free fin based device in lateral epitaxy overgrowth region

INTEL CORP0 citations52
US10217732B2Feb 26, 2019

Techniques for forming a compacted array of functional cells

INTEL CORP0 citations48

PILLARISETTY RAVI

3 patents

GOEL NITI

3 patents

MUKHERJEE NILOY

2 patents

RADOSAVLJEVIC MARKO

1 patent

DASGUPTA SANSAPTAK

1 patent