P

Inventor

CHAU ROBERT S

US419 patents
⚠️ This page may combine multiple inventors who share the name “CHAU ROBERT S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

45 patents
US7531437B2May 12, 2009

Method of forming metal gate electrodes using sacrificial gate electrode material and sacrificial gate dielectric material

INTEL CORP195 citations99
US7518196B2Apr 14, 2009

Field effect transistor with narrow bandgap source and drain regions and method of fabrication

INTEL CORP72 citations99
US7485536B2Feb 3, 2009

Abrupt junction formation by atomic layer epitaxy of in situ delta doped dopant diffusion barriers

INTEL CORP155 citations99
US7358121B2Apr 15, 2008

Tri-gate devices and methods of fabrication

INTEL CORP153 citations99
US7241653B2Jul 10, 2007

Nonplanar device with stress incorporation layer and method of fabrication

INTEL CORP125 citations99
US7170120B2Jan 30, 2007

Carbon nanotube energy well (CNEW) field effect transistor

INTEL CORP149 citations99
US7126199B2Oct 24, 2006

Multilayer metal gate electrode

INTEL CORP154 citations99
US7105390B2Sep 12, 2006

Nonplanar transistors with metal gate electrodes

INTEL CORP416 citations99
US7022559B2Apr 4, 2006

MOSFET gate electrodes having performance tuned work functions and methods of making same

INTEL CORP216 citations99
US7005366B2Feb 28, 2006

Tri-gate devices and methods of fabrication

INTEL CORP121 citations99
US6974738B2Dec 13, 2005

Nonplanar device with stress incorporation layer and method of fabrication

INTEL CORP97 citations99
US6914295B2Jul 5, 2005

Tri-gate devices and methods of fabrication

INTEL CORP71 citations99
US6909151B2Jun 21, 2005

Nonplanar device with stress incorporation layer and method of fabrication

INTEL CORP241 citations99
US6887762B1May 3, 2005

Method of fabricating a field effect transistor structure with abrupt source/drain junctions

INTEL CORP141 citations99
US6885084B2Apr 26, 2005

Semiconductor transistor having a stressed channel

INTEL CORP159 citations99
US6861318B2Mar 1, 2005

Semiconductor transistor having a stressed channel

INTEL CORP165 citations99
US6858478B2Feb 22, 2005

Tri-gate devices and methods of fabrication

INTEL CORP629 citations99
US6797556B2Sep 28, 2004

MOS transistor structure and method of fabrication

INTEL CORP139 citations99
US6653700B2Nov 25, 2003

Transistor structure and method of fabrication

INTEL CORP144 citations99
US6621131B2Sep 16, 2003

Semiconductor transistor having a stressed channel

INTEL CORP534 citations99
US6214679B1Apr 10, 2001

Cobalt salicidation method on a silicon germanium film

INTEL CORP218 citations99
US6165826ADec 26, 2000

Transistor with low resistance tip and method of fabrication in a CMOS process

INTEL CORP301 citations99
US5783478AJul 21, 1998

Method of frabricating a MOS transistor having a composite gate electrode

INTEL CORP157 citations99
US5780346AJul 14, 1998

N2 O nitrided-oxide trench sidewalls and method of making isolation structure

INTEL CORP141 citations99
US5763922AJun 9, 1998

CMOS integrated circuit having PMOS and NMOS devices with different gate dielectric layers

INTEL CORP224 citations99
US5625217AApr 29, 1997

MOS transistor having a composite gate electrode and method of fabrication

INTEL CORP162 citations99
US7898041B2Mar 1, 2011

Block contact architectures for nanoscale channel transistors

INTEL CORP113 citations98
US7569443B2Aug 4, 2009

Complementary metal oxide semiconductor integrated circuit using raised source drain and replacement metal gate

INTEL CORP72 citations98
US7547637B2Jun 16, 2009

Methods for patterning a semiconductor film

INTEL CORP52 citations98
US7525160B2Apr 28, 2009

Multigate device with recessed strain regions

INTEL CORP65 citations98
US7485503B2Feb 3, 2009

Dielectric interface for group III-V semiconductor device

INTEL CORP63 citations98
US7479421B2Jan 20, 2009

Process for integrating planar and non-planar CMOS transistors on a bulk substrate and article made thereby

INTEL CORP105 citations98
US7456476B2Nov 25, 2008

Nonplanar semiconductor device with partially or fully wrapped around gate electrode and methods of fabrication

INTEL CORP222 citations98
US7407847B2Aug 5, 2008

Stacked multi-gate transistor design and method of fabrication

INTEL CORP99 citations98
US7390709B2Jun 24, 2008

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP71 citations98
US7381608B2Jun 3, 2008

Method for making a semiconductor device with a high-k gate dielectric and a metal gate electrode

INTEL CORP85 citations98
US7361958B2Apr 22, 2008

Nonplanar transistors with metal gate electrodes

INTEL CORP86 citations98
US7329913B2Feb 12, 2008

Nonplanar transistors with metal gate electrodes

INTEL CORP114 citations98
US7326656B2Feb 5, 2008

Method of forming a metal oxide dielectric

INTEL CORP456 citations98
US7279375B2Oct 9, 2007

Block contact architectures for nanoscale channel transistors

INTEL CORP93 citations98
US7226831B1Jun 5, 2007

Device with scavenging spacer layer

INTEL CORP60 citations98
US7220635B2May 22, 2007

Method for making a semiconductor device with a metal gate electrode that is formed on an annealed high-k gate dielectric layer

INTEL CORP78 citations98
US7217611B2May 15, 2007

Methods for integrating replacement metal gate structures

INTEL CORP70 citations98
US7208361B2Apr 24, 2007

Replacement gate process for making a semiconductor device that includes a metal gate electrode

INTEL CORP128 citations98
US7157378B2Jan 2, 2007

Method for making a semiconductor device having a high-k gate dielectric layer and a metal gate electrode

INTEL CORP107 citations98

PILLARISETTY RAVI

2 patents

MUKHERJEE NILOY

1 patent

RACHMADY WILLY

1 patent

DEWEY GILBERT

1 patent

Showing the top 50 of 419 patents by PatentIndex Score.