Inventor

SON YOUNG JAE

KR3 patents

⚠️ This page may combine multiple inventors who share the name “SON YOUNG JAE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

1 patent

US6901014B2May 31, 2005

Circuits and methods for screening for defective memory cells in semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD47 citations90

SON YOUNG-JAE

1 patent

US8578227B2Nov 5, 2013

Delay test device and system-on-chip having the same

SON YOUNG-JAE1 citations43

KANG BYUNG-HO

1 patent

US8885394B2Nov 11, 2014

Semiconductor device with complementary global bit lines, operating method, and memory system

KANG BYUNG-HO0 citations36