P

Inventor

FITZPATRICK JAMES

US130 patents
⚠️ This page may combine multiple inventors who share the name “FITZPATRICK JAMES”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

30 patents
US11086572B1Aug 10, 2021

Self adapting iterative read calibration to retrieve data from memory cells

MICRON TECHNOLOGY INC20 citations94
US11081200B1Aug 3, 2021

Intelligent proactive responses to operations to read data from memory cells

MICRON TECHNOLOGY INC18 citations94
US11049582B1Jun 29, 2021

Detection of an incorrectly located read voltage

MICRON TECHNOLOGY INC16 citations94
US11029890B1Jun 8, 2021

Compound feature generation in classification of error rate of data retrieved from memory cells

MICRON TECHNOLOGY INC25 citations94
US11562793B2Jan 24, 2023

Read soft bits through boosted modulation following reading hard bits

MICRON TECHNOLOGY INC8 citations86
US11474748B2Oct 18, 2022

Compound feature generation in classification of error rate of data retrieved from memory cells

MICRON TECHNOLOGY INC12 citations86
US11403042B2Aug 2, 2022

Self adapting iterative read calibration to retrieve data from memory cells

MICRON TECHNOLOGY INC9 citations86
US11355203B2Jun 7, 2022

Determine optimized read voltage via identification of distribution shape of signal and noise characteristics

MICRON TECHNOLOGY INC6 citations86
US11335407B1May 17, 2022

One-ladder read of memory cells coarsely programmed via interleaved two-pass data programming techniques

MICRON TECHNOLOGY INC6 citations86
US11257546B2Feb 22, 2022

Reading of soft bits and hard bits from memory cells

MICRON TECHNOLOGY INC11 citations86
US11238953B2Feb 1, 2022

Determine bit error count based on signal and noise characteristics centered at an optimized read voltage

MICRON TECHNOLOGY INC6 citations86
US11237726B2Feb 1, 2022

Memory system performance enhancements using measured signal and noise characteristics of memory cells

MICRON TECHNOLOGY INC12 citations86
US11221800B2Jan 11, 2022

Adaptive and/or iterative operations in executing a read command to retrieve data from memory cells

MICRON TECHNOLOGY INC11 citations86
US11024401B1Jun 1, 2021

Compute an optimized read voltage

MICRON TECHNOLOGY INC15 citations86
US11200959B1Dec 14, 2021

Optimization of soft bit windows based on signal and noise characteristics of memory cells

MICRON TECHNOLOGY INC7 citations84
US11657886B2May 23, 2023

Intelligent proactive responses to operations to read data from memory cells

MICRON TECHNOLOGY INC4 citations75
US12009040B2Jun 11, 2024

Detection of an incorrectly located read voltage

MICRON TECHNOLOGY INC1 citations73
US12009034B2Jun 11, 2024

Classification of error rate of data retrieved from memory cells

MICRON TECHNOLOGY INC2 citations73
US11983067B2May 14, 2024

Adjustment of code rate as function of memory endurance state metric

MICRON TECHNOLOGY INC2 citations73
US11829245B2Nov 28, 2023

Multi-layer code rate architecture for copyback between partitions with different code rates

MICRON TECHNOLOGY INC3 citations73
US11775217B2Oct 3, 2023

Adaptive and/or iterative operations in executing a read command to retrieve data from memory cells

MICRON TECHNOLOGY INC3 citations73
US11762599B2Sep 19, 2023

Self adapting iterative read calibration to retrieve data from memory cells

MICRON TECHNOLOGY INC3 citations73
US11740970B2Aug 29, 2023

Dynamic adjustment of data integrity operations of a memory system based on error rate classification

MICRON TECHNOLOGY INC3 citations73
US11726719B2Aug 15, 2023

Compound feature generation in classification of error rate of data retrieved from memory cells

MICRON TECHNOLOGY INC3 citations73
US11670396B2Jun 6, 2023

Determine bit error count based on signal and noise characteristics centered at an optimized read voltage

MICRON TECHNOLOGY INC3 citations73
US11662905B2May 30, 2023

Memory system performance enhancements using measured signal and noise characteristics of memory cells

MICRON TECHNOLOGY INC3 citations73
US11587638B2Feb 21, 2023

Read model of memory cells using information generated during read operations

MICRON TECHNOLOGY INC2 citations73
US11468959B2Oct 11, 2022

Detection of an incorrectly located read voltage

MICRON TECHNOLOGY INC1 citations73
US11456038B2Sep 27, 2022

Simplified operations to read memory cells coarsely programmed via interleaved two-pass data programming techniques

MICRON TECHNOLOGY INC2 citations73
US11276473B2Mar 15, 2022

Coarse calibration based on signal and noise characteristics of memory cells collected in prior calibration operations

MICRON TECHNOLOGY INC3 citations73

QUANTUM CORP

6 patents

SANDISK ENTPR IP LLC

4 patents

SMART STORAGE SYSTEMS INC

2 patents

ARDCO INC

1 patent

HIGGINS JAMES

1 patent

MAXTOR CORP

1 patent

SANDISK TECHNOLOGIES LLC

1 patent

SANDISK TECHNOLOGIES INC

1 patent

SEAGATE TECHNOLOGY LLC

1 patent

WESTERN DIGITAL TECH INC

1 patent

FITZPATRICK JAMES

1 patent

Showing the top 50 of 130 patents by PatentIndex Score.