Inventor · disambiguated record
Kenshiro Ohtsubo
Also filed as: OHTSUBO Kenshiro
3 granted patents·4 pending applications·0 citations·filing 2013–2022
39Inventor score
Files withHITACHI HIGH TECH CORP7
Top patents by PatentIndex Score
7 records- 0152US12444629B2Substrate inspection deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 14, 2025·0 cites·6 claims
- 0250US2025314484A1Sample surface quality management deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0349US9535009B2Inspection systemHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 3, 2017·0 cites·14 claims
- 0447US2025004043A1Wafer inspection apparatusHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0545US12196673B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 14, 2025·0 cites·10 claims
- 0645US2024280483A1Defect inspection deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0743US2023163018A1Substrate holding apparatus and substrate processing apparatusHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →