Inventor

GOLDENSHTEIN ALEX

IL10 patents

⚠️ This page may combine multiple inventors who share the name “GOLDENSHTEIN ALEX”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS ISRAEL LTD

7 patents

US9673023B2Jun 6, 2017

System for discharging an area that is scanned by an electron beam

APPLIED MATERIALS ISRAEL LTD4 citations70

US10168614B1Jan 1, 2019

On-axis illumination and alignment for charge control during charged particle beam inspection

APPLIED MATERIALS ISRAEL LTD1 citations61

US7400390B2Jul 15, 2008

APPLIED MATERIALS INC

2 patents

US7072502B2Jul 4, 2006

Alternating phase-shift mask inspection method and apparatus

APPLIED MATERIALS INC32 citations90

US7800062B2Sep 21, 2010

Method and system for the examination of specimen

APPLIED MATERIALS INC6 citations59

ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH

1 patent

US11545338B2Jan 3, 2023

Charged particle beam apparatus and method of controlling sample charge

ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH1 citations56

GOLDENSHTEIN ALEX

APPLIED MATERIALS ISRAEL LTD

System for discharging an area that is scanned by an electron beam

On-axis illumination and alignment for charge control during charged particle beam inspection

Inspection system and a method for aerial reticle inspection

Inspection of a lithographic mask that is protected by a pellicle

Inspection of a lithographic mask that is protected by a pellicle

System for discharging an area that is scanned by an electron beam

Electrical impedance measurement using an electron beam

APPLIED MATERIALS INC

Alternating phase-shift mask inspection method and apparatus

Method and system for the examination of specimen

ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH

Charged particle beam apparatus and method of controlling sample charge