P

Inventor

JIANG PING

CN110 patents
⚠️ This page may combine multiple inventors who share the name “JIANG PING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEXAS INSTRUMENTS INC

13 patents
US6455411B1Sep 24, 2002

Defect and etch rate control in trench etch for dual damascene patterning of low-k dielectrics

TEXAS INSTRUMENTS INC86 citations96
US6410426B1Jun 25, 2002

Damascene cap layer process for integrated circuit interconnects

TEXAS INSTRUMENTS INC47 citations93
US7741224B2Jun 22, 2010

Plasma treatment and repair processes for reducing sidewall damage in low-k dielectrics

TEXAS INSTRUMENTS INC20 citations90
US6797633B2Sep 28, 2004

In-situ plasma ash/treatment after via etch of low-k films for poison-free dual damascene trench patterning

TEXAS INSTRUMENTS INC27 citations90
US7214609B2May 8, 2007

Methods for forming single damascene via or trench cavities and for forming dual damascene via cavities

TEXAS INSTRUMENTS INC33 citations89
US7338888B2Mar 4, 2008

Method for manufacturing a semiconductor device having a silicided gate electrode and a method for manufacturing an integrated circuit including the same

TEXAS INSTRUMENTS INC12 citations84
US6900123B2May 31, 2005

BARC etch comprising a selective etch chemistry and a high polymerizing gas for CD control

TEXAS INSTRUMENTS INC12 citations84
US7148143B2Dec 12, 2006

Semiconductor device having a fully silicided gate electrode and method of manufacture therefor

TEXAS INSTRUMENTS INC15 citations83
US7129162B2Oct 31, 2006

Dual cap layer in damascene interconnection processes

TEXAS INSTRUMENTS INC14 citations83
US7183187B2Feb 27, 2007

Integration scheme for using silicided dual work function metal gates

TEXAS INSTRUMENTS INC16 citations79
US8008200B2Aug 30, 2011

Poison-free and low ULK damage integration scheme for damascene interconnects

TEXAS INSTRUMENTS INC6 citations73
US7300878B1Nov 27, 2007

Gas switching during an etch process to modulate the characteristics of the etch

TEXAS INSTRUMENTS INC7 citations73
US6645781B1Nov 11, 2003

Method to determine a complete etch in integrated devices

TEXAS INSTRUMENTS INC12 citations71

CYSPO TECH SHEN ZHEN CO LTD

3 patents

SHENZHEN AIXULI TECH CO LTD

3 patents

TOSHIBA KK

3 patents

ADVANCED TECH MATERIALS

2 patents

SCHWEITZER ENGINEERING LAB INC

2 patents

CHEN TIANNIU

2 patents

JIANG PING

2 patents

UNIV CLEMSON

2 patents

CELLERANT THERAPEUTICS INC

2 patents

BEIJING XINCHEN OFFICE EQUIPMENT CO LTD

2 patents

CHEN LEE

1 patent

MI LLC

1 patent

MYRIAD GENETICS INC

1 patent

FROST GREGORY I

1 patent

RATH MELISSA K

1 patent

BROSSEAU André

1 patent

ENTEGRIS INC

1 patent

DONGGUAN HUAJIN GIFTS CO LTD

1 patent

TEXAX INSTR INC

1 patent

ANTICANCER INC

1 patent

PRINX CHENGSHAN QINGDAO INDUSTRIAL RES AND DESIGN CO LTD

1 patent

KORZENSKI MICHAEL B

1 patent

VISINTIN PAMELA M

1 patent

ZHUZHOU CRRC TIMES ELECTRIC CO LTD

1 patent

Showing the top 50 of 110 patents by PatentIndex Score.