Inventor
LIN DA-WEN
TW64 patents
⚠️ This page may combine multiple inventors who share the name “LIN DA-WEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
22 patentsUS10468500B1Nov 5, 2019
FinFET fabrication methods
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10153344B2Dec 11, 2018
Formation of dislocations in source and drain regions of FinFET devices
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9768256B2Sep 19, 2017
Formation of dislocations in source and drain regions of FinFET devices
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US9768277B2Sep 19, 2017
Method and apparatus of forming an integrated circuit with a strained channel region
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10466731B2Nov 5, 2019
Two-transistor bandgap reference circuit and FinFET device suited for same
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations83
US11276766B2Mar 15, 2022
FinFET fabrication methods
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10522417B2Dec 31, 2019
FinFET device with different liners for PFET and NFET and method of fabricating thereof
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9620386B2Apr 11, 2017
Methods of annealing after deposition of gate layers
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9537010B2Jan 3, 2017
Semiconductor device structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US12363937B2Jul 15, 2025
Multi-gate device and related methods
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12255230B2Mar 18, 2025
Semiconductor structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12057506B2Aug 6, 2024
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12040383B2Jul 16, 2024
Multi-gate device and related methods
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US11211455B2Dec 28, 2021
Formation of dislocations in source and drain regions of FinFET devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12191401B2Jan 7, 2025
Manufacturing method for semiconductor structure having a plurality of fins
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12125889B2Oct 22, 2024
Source/drain contact with low-k contact etch stop layer and method of fabricating thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12068392B2Aug 20, 2024
FinFET fabrication methods
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11916151B2Feb 27, 2024
Semiconductor structure having fin with all around gate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11810827B2Nov 7, 2023
FinFET device with different liners for PFET and NFET and method of fabricating thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11031299B2Jun 8, 2021
FinFET device with different liners for PFET and NFET and method of fabricating thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9412870B2Aug 9, 2016
Device with engineered epitaxial region and methods of making same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US11150680B2Oct 19, 2021
Two-transistor bandgap reference circuit and FinFET device suited for same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
TAIWAN SEMICONDUCTOR MFG
14 patentsUS9293534B2Mar 22, 2016
Formation of dislocations in source and drain regions of FinFET devices
TAIWAN SEMICONDUCTOR MFG27 citations94
US6673683B1Jan 6, 2004
Damascene gate electrode method for fabricating field effect transistor (FET) device with ion implanted lightly doped extension regions
TAIWAN SEMICONDUCTOR MFG42 citations92
US6670226B2Dec 30, 2003
Planarizing method for fabricating gate electrodes
TAIWAN SEMICONDUCTOR MFG20 citations92
US7071515B2Jul 4, 2006
Narrow width effect improvement with photoresist plug process and STI corner ion implantation
TAIWAN SEMICONDUCTOR MFG42 citations90
US9373704B2Jun 21, 2016
Multiple-gate semiconductor device and method
TAIWAN SEMICONDUCTOR MFG6 citations84
US9362278B1Jun 7, 2016
FinFET with multiple dislocation planes and method for forming the same
TAIWAN SEMICONDUCTOR MFG7 citations84
US9105664B2Aug 11, 2015
Method for enhancing channel strain
TAIWAN SEMICONDUCTOR MFG6 citations84
US8895383B2Nov 25, 2014
Multiple-gate semiconductor device and method
TAIWAN SEMICONDUCTOR MFG7 citations84
US8383513B2Feb 26, 2013
Asymmetric rapid thermal annealing to reduce pattern effect
TAIWAN SEMICONDUCTOR MFG5 citations84
US8357579B2Jan 22, 2013
Methods of forming integrated circuits
TAIWAN SEMICONDUCTOR MFG8 citations84
US7012014B2Mar 14, 2006
Recessed gate structure with reduced current leakage and overlap capacitance
TAIWAN SEMICONDUCTOR MFG18 citations84
US8703593B2Apr 22, 2014
Techniques for FinFET doping
TAIWAN SEMICONDUCTOR MFG6 citations83
US7399679B2Jul 15, 2008
Narrow width effect improvement with photoresist plug process and STI corner ion implantation
TAIWAN SEMICONDUCTOR MFG5 citations71
US7795119B2Sep 14, 2010
Flash anneal for a PAI, NiSi process
TAIWAN SEMICONDUCTOR MFG3 citations61
TSAI CHUN HSIUNG
3 patentsLIN DA-WEN
2 patentsCHENG MING-LUNG
1 patentTSENG CHIH-HUNG
1 patentLEE TUNG YING
1 patentHUANG YU-LIEN
1 patentTAIWAN SEMICONDUCTOR MANFACTUR
1 patentLAI KAO-TING
1 patentCHIANG CHUNG-YU
1 patentTAIWAN SEMICONDUCTOR MFG COMPANY LTD
1 patentWONG KING-YUEN
1 patentShowing the top 50 of 64 patents by PatentIndex Score.