Inventor · disambiguated record
Lee D. Whetsel
Also filed as: WHETSEL JR LEE D · WHETSEL JR LEE DOYLE · WHETSEL LEE · WHETSEL LEE D
867 granted patents·45 pending applications·7,677 citations·filing 1987–2025
99Inventor score
Top patents by PatentIndex Score
912 records- 0199US11609269B2Device testing architecture of an integrated circuitTEXAS INSTRUMENTS INC·Filed 2021·Granted Mar 21, 2023·4 cites·8 claims
- 0299US10120023B23D tap and scan port architecturesTEXAS INSTRUMENTS INC·Filed 2018·Granted Nov 6, 2018·10 cites·13 claims
- 0399US9746517B2IC interposer with TAP controller and output boundary scan cellTEXAS INSTRUMENTS INC·Filed 2016·Granted Aug 29, 2017·36 cites·3 claims
- 0499US9720039B2Interleaver ic with up control and capture, shift, update circuitryTEXAS INSTRUMENTS INC·Filed 2016·Granted Aug 1, 2017·12 cites·4 claims
- 0599US9229056B2IC die top, bottom signals, tap lock, test, scan circuitryTEXAS INSTRUMENTS INC·Filed 2015·Granted Jan 5, 2016·16 cites·9 claims
- 0699US8977919B2Scan, test, and control circuits coupled to IC surfaces contactsTEXAS INSTRUMENTS INC·Filed 2013·Granted Mar 10, 2015·34 cites·3 claims
- 0799US7571364B2Selectable JTAG or trace access with data store and outputTEXAS INSTRUMENTS INC·Filed 2006·Granted Aug 4, 2009·55 cites·10 claims
- 0898US12130328B2Interface to full and reduced pin JTAG devicesTEXAS INSTRUMENTS INC·Filed 2023·Granted Oct 29, 2024·1 cites·20 claims
- 0998US12092687B2Selectable JTAG or trace access with data store and outputTEXAS INSTRUMENTS INC·Filed 2023·Granted Sep 17, 2024·2 cites·18 claims
- 1098US12050247B2Addressable test access portTEXAS INSTRUMENTS INC·Filed 2023·Granted Jul 30, 2024·1 cites·18 claims
- 1198US11965930B2Test compression in a JTAG daisy-chain environmentTEXAS INSTRUMENTS INC·Filed 2023·Granted Apr 23, 2024·1 cites·14 claims
- 1298US11860224B2Interposer instrumentation method and apparatusTEXAS INSTRUMENTS INC·Filed 2022·Granted Jan 2, 2024·2 cites·14 claims
- 1398US11835573B2TSV testing method and apparatusTEXAS INSTRUMENTS INC·Filed 2021·Granted Dec 5, 2023·2 cites·20 claims
- 1498US11567131B2Programmable test compression architecture input/output shift register coupled to SCI/SCO/PCOTEXAS INSTRUMENTS INC·Filed 2021·Granted Jan 31, 2023·2 cites·15 claims
- 1598US11333703B2Interposer instrumentation method and apparatusTEXAS INSTRUMENTS INC·Filed 2021·Granted May 17, 2022·3 cites·17 claims
- 1698US11237206B2TSV testing method and apparatusTEXAS INSTRUMENTS INC·Filed 2020·Granted Feb 1, 2022·3 cites·15 claims
- 1798US11199583B2Programmable test compression architecture input/output shift register coupled to SCI/SCO/PCOTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 14, 2021·3 cites·16 claims
- 1898US10267852B2Inputting TDI addresses when TDI high, moving update-DR to RT/ITEXAS INSTRUMENTS INC·Filed 2018·Granted Apr 23, 2019·6 cites·15 claims
- 1998US10060980B2Two signal JTAG with TLM, scan domain and diagnostics domainTEXAS INSTRUMENTS INC·Filed 2018·Granted Aug 28, 2018·7 cites·15 claims
- 2098US10012695B2Die top, bottom parallel/serial date with test and scan circuitryTEXAS INSTRUMENTS INC·Filed 2017·Granted Jul 3, 2018·10 cites·8 claims
- 2198US9733308B2Tap, CMD with two flip-flops, routing circuit, and data registerTEXAS INSTRUMENTS INC·Filed 2016·Granted Aug 15, 2017·8 cites·13 claims
- 2298US9535126B2Tap, test, CSU, scan circuitry with top and bottom contactsTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 3, 2017·10 cites·9 claims
- 2398US9417284B2IC die with tap lock, test, scan, and up circuitryTEXAS INSTRUMENTS INC·Filed 2016·Granted Aug 16, 2016·10 cites·9 claims
- 2498US9285425B2Test access mechanism, controller, selector, scan router, external data busTEXAS INSTRUMENTS INC·Filed 2015·Granted Mar 15, 2016·10 cites·5 claims
- 2598US8924802B2IC TAP with dual port router and additional capture inputWHETSEL LEE D·Filed 2012·Granted Dec 30, 2014·20 cites·3 claims
- 2698US8910003B2Controller circuitry with state machines, address store/compare, and shift registerWHETSEL LEE D·Filed 2014·Granted Dec 9, 2014·11 cites·4 claims
- 2798US8560905B2Programmable test compression architecture with serial input register and multiplexerWHETSEL LEE D·Filed 2012·Granted Oct 15, 2013·15 cites·1 claims
- 2898US8112685B2Serial compressed data I/O in a parallel test compression architectureWHETSEL LEE D·Filed 2010·Granted Feb 7, 2012·19 cites·1 claims
- 2998US7984349B2IC multiplexer control circuitry for tap selection circuitryTEXAS INSTRUMENTS INC·Filed 2010·Granted Jul 19, 2011·18 cites·4 claims
- 3098US6804725B1IC with state machine controlled linking moduleTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 12, 2004·75 cites·16 claims
- 3198US6763488B2Generator/compactor scan circuit low power adapter with counterTEXAS INSTRUMENTS INC·Filed 2001·Granted Jul 13, 2004·109 cites·5 claims
- 3298US6643810B2Integrated circuits carrying intellectual property cores and test portsTEXAS INSTRUMENTS INC·Filed 2002·Granted Nov 4, 2003·113 cites·4 claims
- 3398US6408413B1Hierarchical access of test access ports in embedded core integrated circuitsTEXAS INSTRUMENTS INC·Filed 1999·Granted Jun 18, 2002·148 cites·11 claims
- 3498US6199182B1Probeless testing of pad buffers on waferTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 6, 2001·131 cites·31 claims
- 3598US5483518AAddressable shadow port and protocol for serial bus networksTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 9, 1996·170 cites·8 claims
- 3697US11231463B2Programmable test compression architecture input/output shift register coupled to SCI/SCO/PCOTEXAS INSTRUMENTS INC·Filed 2020·Granted Jan 25, 2022·3 cites·17 claims
- 3797US10520551B2Tap, command, and router circuitry and asynchronous data registerTEXAS INSTRUMENTS INC·Filed 2018·Granted Dec 31, 2019·5 cites·16 claims
- 3897US10209305B2Wafer tap domain die channel circuitry with separate die clocksTEXAS INSTRUMENTS INC·Filed 2018·Granted Feb 19, 2019·5 cites·2 claims
- 3997US10054639B2Test access port and TCK inverter for shadow access portTEXAS INSTRUMENTS INC·Filed 2017·Granted Aug 21, 2018·6 cites·4 claims
- 4097US9535118B2TAP addressable circuit with bi-directional TMS and second signal leadTEXAS INSTRUMENTS INC·Filed 2015·Granted Jan 3, 2017·7 cites·5 claims
- 4197US9529043B2Tap counting circuit scan clock prime and enable prime leadsTEXAS INSTRUMENTS INC·Filed 2015·Granted Dec 27, 2016·7 cites·9 claims
- 4297US9329233B2TAP with AUX capture input, gated capture and shiftDR outputsTEXAS INSTRUMENTS INC·Filed 2015·Granted May 3, 2016·14 cites·3 claims
- 4397US9146825B2At speed TAP, dual port router, and command flip-flop circuitryTEXAS INSTRUMENTS INC·Filed 2014·Granted Sep 29, 2015·10 cites·4 claims
- 4497US8694844B2AT speed TAP with dual port router and command circuitWHETSEL LEE D·Filed 2011·Granted Apr 8, 2014·31 cites·3 claims
- 4597US8522095B2Tap with address, state monitor and gating circuitryWHETSEL LEE D·Filed 2012·Granted Aug 27, 2013·11 cites·3 claims
- 4697US8453024B2I/O and comparator circuitry with compare gate and mask circuitryWHETSEL LEE D·Filed 2012·Granted May 28, 2013·11 cites·3 claims
- 4797US8392773B2Bi-directional TMS lead carrying TMS and frame data in/out signalsWHETSEL LEE D·Filed 2012·Granted Mar 5, 2013·10 cites·2 claims
- 4897US8301946B2Inverted TCK access port selector with normal TCK data flip-flopWHETSEL LEE D·Filed 2011·Granted Oct 30, 2012·12 cites·5 claims
- 4997US8230280B2Source and destination data circuitry coupled to bi-directional TMS leadWHETSEL LEE D·Filed 2010·Granted Jul 24, 2012·14 cites·6 claims
- 5097US8166358B2Test access port with address and command capabilityWHETSEL LEE D·Filed 2010·Granted Apr 24, 2012·12 cites·4 claims
Showing the top 50 of 912 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →