P

Inventor

CHENG CHIH-FENG

TW29 patents
⚠️ This page may combine multiple inventors who share the name “CHENG CHIH-FENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBAL UNICHIP CORP

21 patents
US11340288B1May 24, 2022

Testing equipment, its component carrying device and testing method of the testing equipment

GLOBAL UNICHIP CORP3 citations72
US10154612B1Dec 11, 2018

Electronic device having active heat dissipation

GLOBAL UNICHIP CORP6 citations72
US12140623B2Nov 12, 2024

Testing apparatus

GLOBAL UNICHIP CORP0 citations61
US11852470B2Dec 26, 2023

Inspecting device

GLOBAL UNICHIP CORP0 citations61
US11703244B2Jul 18, 2023

Testing apparatus

GLOBAL UNICHIP CORP0 citations61
US11624759B1Apr 11, 2023

Inspecting device and its testing socket

GLOBAL UNICHIP CORP0 citations61
US10566217B2Feb 18, 2020

Drying apparatus

GLOBAL UNICHIP CORP1 citations61
US10502775B2Dec 10, 2019

Testing equipment for semiconductor element and its carrying device

GLOBAL UNICHIP CORP1 citations61
US10274516B2Apr 30, 2019

Probe card system, probe loader device and manufacturing method of the probe loader device

GLOBAL UNICHIP CORP1 citations61
US12583661B2Mar 24, 2026

Chip storing device

GLOBAL UNICHIP CORP0 citations51
US12484149B2Nov 25, 2025

Electric device, its circuit board and method of manufacturing the electric device

GLOBAL UNICHIP CORP0 citations51
US12243703B2Mar 4, 2025

Probe card device and circuit protection assembly thereof

GLOBAL UNICHIP CORP0 citations51
US11848250B2Dec 19, 2023

Thermal peak suppression device

GLOBAL UNICHIP CORP0 citations51
US11699457B2Jul 11, 2023

Testing system, crack noise monitoring device and method for monitoring crack noise

GLOBAL UNICHIP CORP0 citations51
US11156639B2Oct 26, 2021

Probe card module

GLOBAL UNICHIP CORP0 citations51
US10598724B2Mar 24, 2020

Testing system for semiconductor package components and its thermal barrier layer element

GLOBAL UNICHIP CORP0 citations51
US10132835B2Nov 20, 2018

Testing apparatus and its probe connector

GLOBAL UNICHIP CORP0 citations51
US10041817B2Aug 7, 2018

Damping component and integrated-circuit testing apparatus using the same

GLOBAL UNICHIP CORP0 citations51
US9678110B2Jun 13, 2017

Probe card

GLOBAL UNICHIP CORP0 citations51
US11740260B2Aug 29, 2023

Pogo pin-free testing device for IC chip test and testing method of IC chip

GLOBAL UNICHIP CORP0 citations46
US10048290B2Aug 14, 2018

Probe card device

GLOBAL UNICHIP CORP0 citations40

BIZLINK INT CORPORATION

2 patents

CAL COMP BIG DATA INC

1 patent

BIZLINK INT CORP

1 patent

AVERMEDIA TECH INC

1 patent

Sun yu-min

1 patent

CHENG CHIH-FENG

1 patent

IND TECH RES INST

1 patent