Inventor
CHENG CHIH-FENG
TW29 patents
⚠️ This page may combine multiple inventors who share the name “CHENG CHIH-FENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBAL UNICHIP CORP
21 patentsUS11340288B1May 24, 2022
Testing equipment, its component carrying device and testing method of the testing equipment
GLOBAL UNICHIP CORP3 citations72
US10154612B1Dec 11, 2018
Electronic device having active heat dissipation
GLOBAL UNICHIP CORP6 citations72
US12140623B2Nov 12, 2024
Testing apparatus
GLOBAL UNICHIP CORP0 citations61
US11852470B2Dec 26, 2023
Inspecting device
GLOBAL UNICHIP CORP0 citations61
US11703244B2Jul 18, 2023
Testing apparatus
GLOBAL UNICHIP CORP0 citations61
US11624759B1Apr 11, 2023
Inspecting device and its testing socket
GLOBAL UNICHIP CORP0 citations61
US10566217B2Feb 18, 2020
Drying apparatus
GLOBAL UNICHIP CORP1 citations61
US10502775B2Dec 10, 2019
Testing equipment for semiconductor element and its carrying device
GLOBAL UNICHIP CORP1 citations61
US10274516B2Apr 30, 2019
Probe card system, probe loader device and manufacturing method of the probe loader device
GLOBAL UNICHIP CORP1 citations61
US12583661B2Mar 24, 2026
Chip storing device
GLOBAL UNICHIP CORP0 citations51
US12484149B2Nov 25, 2025
Electric device, its circuit board and method of manufacturing the electric device
GLOBAL UNICHIP CORP0 citations51
US12243703B2Mar 4, 2025
Probe card device and circuit protection assembly thereof
GLOBAL UNICHIP CORP0 citations51
US11848250B2Dec 19, 2023
Thermal peak suppression device
GLOBAL UNICHIP CORP0 citations51
US11699457B2Jul 11, 2023
Testing system, crack noise monitoring device and method for monitoring crack noise
GLOBAL UNICHIP CORP0 citations51
US11156639B2Oct 26, 2021
Probe card module
GLOBAL UNICHIP CORP0 citations51
US10598724B2Mar 24, 2020
Testing system for semiconductor package components and its thermal barrier layer element
GLOBAL UNICHIP CORP0 citations51
US10132835B2Nov 20, 2018
Testing apparatus and its probe connector
GLOBAL UNICHIP CORP0 citations51
US10041817B2Aug 7, 2018
Damping component and integrated-circuit testing apparatus using the same
GLOBAL UNICHIP CORP0 citations51
US9678110B2Jun 13, 2017
Probe card
GLOBAL UNICHIP CORP0 citations51
US11740260B2Aug 29, 2023
Pogo pin-free testing device for IC chip test and testing method of IC chip
GLOBAL UNICHIP CORP0 citations46
US10048290B2Aug 14, 2018
Probe card device
GLOBAL UNICHIP CORP0 citations40