Inventor
LEE HYUN-AE
KR2 patents
Patents
2 patentsUS7990168B2Aug 2, 2011
Probe card including a sub-plate with a main supporter and a sub-supporter with the sub-supporter having probe needles
SAMSUNG ELECTRONICS CO LTD3 citations60
US7888956B2Feb 15, 2011
Apparatus for testing a semiconductor device and a method of fabricating and using the same
SAMSUNG ELECTRONICS CO LTD4 citations54