Inventor

PAN WEI-CHENG

TW2 patents

Patents

2 patents

US10535157B2Jan 14, 2020

Positioning and measuring system based on image scale

UNIV NAT TSING HUA0 citations35

US10475205B2Nov 12, 2019

Positioning and measuring system based on flexible feature image scale

UNIV NAT TSING HUA0 citations35