P

Inventor

FEHRMANN FRANK

DE8 patents
⚠️ This page may combine multiple inventors who share the name “FEHRMANN FRANK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MPI CORP

3 patents
US11703541B2Jul 18, 2023

Semiconductor inspecting method for ensuring scrubbing length on pad

MPI CORP0 citations59
US11693050B2Jul 4, 2023

Semiconductor inspecting method

MPI CORP0 citations59
US10996239B1May 4, 2021

Method of positioning probe tips relative to pads

MPI CORP0 citations45

SUSS MICROTEC TEST SYS GMBH

1 patent
US7057408B2Jun 6, 2006

Method and prober for contacting a contact area with a contact tip

SUSS MICROTEC TEST SYS GMBH11 citations81

DIETRICH CLAUS

1 patent
US9110131B2Aug 18, 2015

Method and device for contacting a row of contact areas with probe tips

DIETRICH CLAUS5 citations65

KANEV STOJAN

1 patent
US8368413B2Feb 5, 2013

Method for testing electronic components of a repetitive pattern under defined thermal conditions

KANEV STOJAN2 citations59

SUSS MICRO TEC TEST SYSTEMS GM

1 patent
US7573283B2Aug 11, 2009

Method for measurement of a device under test

SUSS MICRO TEC TEST SYSTEMS GM3 citations51

CASCADE MICROTECH INC

1 patent
US9373533B2Jun 21, 2016

Systems and methods for providing wafer access in a wafer processing system

CASCADE MICROTECH INC0 citations39