Inventor
OSHIYAMA GEN
JP4 patents
Patents
4 patentsUS9797949B2Oct 24, 2017
Test circuit and method of controlling test circuit
FUJITSU LTD2 citations68
US11755329B2Sep 12, 2023
Arithmetic processing apparatus and method for selecting an executable instruction based on priority information written in response to priority flag comparison
FUJITSU LTD1 citations56
US9835685B2Dec 5, 2017
Test circuit and method for controlling test circuit
FUJITSU LTD0 citations37
US9746878B2Aug 29, 2017
Semiconductor device and method of testing semiconductor device
FUJITSU LTD0 citations36