Inventor
DAMON TIM G
US2 patents
Patents
2 patentsUS6510533B1Jan 21, 2003
Method for detecting or repairing intercell defects in more than one array of a memory device
MICRON TECHNOLOGY INC21 citations89
US6167541ADec 26, 2000
Method for detecting or preparing intercell defects in more than one array of a memory device
MICRON TECHNOLOGY INC11 citations70