Inventor
HICKEL WERNER
DE14 patents
⚠️ This page may combine multiple inventors who share the name “HICKEL WERNER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HOECHST AG
10 patentsUS5733663AMar 31, 1998
Composite membrane and process for its production
HOECHST AG55 citations92
US5432286AJul 11, 1995
Substituted thieno[3,2-b]thiophenes and their use
HOECHST AG24 citations90
US5580612ADec 3, 1996
Process for production of layer element containing at least one monomolecular layer of an amphiphilic molecule and one fullerene
HOECHST AG17 citations79
US5517350AMay 14, 1996
Optical component based on Langmuir-Blodgett layers
HOECHST AG10 citations73
US5658669AAug 19, 1997
Composite membranes and processes for their production
HOECHST AG10 citations72
US5684165ANov 4, 1997
Substituted thieno 3,2b!thiophenes and their use
HOECHST AG7 citations71
US5429842AJul 4, 1995
Process and device for producing ultrathin layers and layer element
HOECHST AG15 citations71
US5402262AMar 28, 1995
Layer element having a plurality of monomolecular layers
HOECHST AG3 citations62
US5256749AOct 26, 1993
Amphiphilic polymers containing silane units and film comprising at least one monomolecular layer produced therefrom
HOECHST AG6 citations62
US5654092AAug 5, 1997
Layer element containing at least one monomolecular layer of a mixture of a fullerene and an amphiphilic molecule
HOECHST AG2 citations60
BASF AG
4 patentsUS5237392AAug 17, 1993
Determination of refractive index and thickness of thin layers
BASF AG23 citations92
US5049462ASep 17, 1991
Reading out information stored in thin polymer layers
BASF AG35 citations91
US5141311AAug 25, 1992
Examination of the physical properties of thin films
BASF AG20 citations81
US5028132AJul 2, 1991
Examination of surface structure
BASF AG12 citations72