Inventor

ELINGS VIRGIL B

US52 patents

⚠️ This page may combine multiple inventors who share the name “ELINGS VIRGIL B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ELINGS VIRGIL B

DIGITAL INSTR INC

Tapping atomic force microscope with phase or frequency detection

Tapping atomic force microscope

Jumping probe microscope

Scanning stylus atomic force microscope with cantilever tracking and optical access

Scanning probe microscope using stored data for vertical probe positioning

Scanning probe microscope using stored data for vertical probe positioning

Scanning probe microscope having automatic probe exchange and alignment

Jumping probe microscope

Methods of operating atomic force microscopes to measure friction

Atomic force microscope

Jumping probe microscope

Method of adjusting the size of the area scanned by a scanning probe

Method of operating a scanning probe microscope to improve drift characteristics

Method of driving a piezoelectric scanner linearly with time

Scanning stylus atomic force microscope with cantilever tracking and optical access

Method and apparatus for obtaining improved vertical metrology measurements

Scanning stylus atomic force microscope with cantilever tracking and optical access

Scanning stylus atomic force microscope with cantilever tracking and optical access

Atomic force microscope

Compact atomic force microscope

Method to increase the speed of a scanning probe microscope

Methods of operating atomic force microscopes to measure friction

Positioning device for scanning probe microscopes

Atomic force microscope for small samples having dual-mode operating capability

Scanner for scanning probe microscopes having reduced Z-axis non-linearity

Scanning probe microscope employing adjustable tilt and unitary head

Drift compensation for scanning probe microscopes using an enhanced probe positioning system

Scanning tunneling microscopes with correction for coupling effects

System for scanning large sample areas with a scanning probe microscope

Feedback control for scanning tunnel microscopes

Positioning device for a scanning tunneling microscope

Compact atomic force microscope

Atomic force microscope

Feedback control for scanning tunnel microscopes

ELINGS VIRGIL B

Apparatus and method for homogeneous immunoassay

Measuring skin perfusion

Apparatus and method for measuring extravascular lung water

Apparatus and method for measuring cardiac output

VEECO INSTR INC

Tapping atomic force microscope with phase or frequency detection

Scan control for scanning probe microscopes

Method and apparatus for atomic force microscopy

Capacitance atomic force microscopes and methods of operating such microscopes

(unassigned)

Scanning probe optical microscope using a solid immersion lens

Atomic force microscope for measuring properties of dielectric and insulating layers

NICOLI DAVID F

Immunoassay using optical interference detection

Automatic dilution system

DIGITAL INSTR

Method for improving the operation of oscillating mode atomic force microscopes

Method and apparatus for measuring mechanical properties on a small scale

UNIV CALIFORNIA

Homogeneous fluoroimmunoassay involving autocorrelation processing of optically sensed signals

Homogeneous fluoroimmunoassay involving sensing radiation for forward and back directions