Inventor
GURLEY JOHN A
US26 patents
⚠️ This page may combine multiple inventors who share the name “GURLEY JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DIGITAL INSTR INC
24 patentsUS5519212AMay 21, 1996
Tapping atomic force microscope with phase or frequency detection
DIGITAL INSTR INC182 citations99
US5412980AMay 9, 1995
Tapping atomic force microscope
DIGITAL INSTR INC215 citations99
US5266801ANov 30, 1993
Jumping probe microscope
DIGITAL INSTR INC191 citations99
US5418363AMay 23, 1995
Scanning probe microscope using stored data for vertical probe positioning
DIGITAL INSTR INC119 citations98
US5308974AMay 3, 1994
Scanning probe microscope using stored data for vertical probe positioning
DIGITAL INSTR INC116 citations98
US5705814AJan 6, 1998
Scanning probe microscope having automatic probe exchange and alignment
DIGITAL INSTR INC183 citations97
US5415027AMay 16, 1995
Jumping probe microscope
DIGITAL INSTR INC62 citations96
US5329808AJul 19, 1994
Atomic force microscope
DIGITAL INSTR INC47 citations96
US5229606AJul 20, 1993
Jumping probe microscope
DIGITAL INSTR INC72 citations96
US5204531AApr 20, 1993
Method of adjusting the size of the area scanned by a scanning probe
DIGITAL INSTR INC61 citations96
US5051646ASep 24, 1991
Method of driving a piezoelectric scanner linearly with time
DIGITAL INSTR INC55 citations96
US5898106AApr 27, 1999
Method and apparatus for obtaining improved vertical metrology measurements
DIGITAL INSTR INC61 citations95
US5224376AJul 6, 1993
Atomic force microscope
DIGITAL INSTR INC64 citations95
US5025658AJun 25, 1991
Compact atomic force microscope
DIGITAL INSTR INC102 citations95
US5306919AApr 26, 1994
Positioning device for scanning probe microscopes
DIGITAL INSTR INC48 citations93
US5253516AOct 19, 1993
Atomic force microscope for small samples having dual-mode operating capability
DIGITAL INSTR INC39 citations93
US5198715AMar 30, 1993
Scanner for scanning probe microscopes having reduced Z-axis non-linearity
DIGITAL INSTR INC45 citations93
US5077473ADec 31, 1991
Drift compensation for scanning probe microscopes using an enhanced probe positioning system
DIGITAL INSTR INC76 citations93
US5066858ANov 19, 1991
Scanning tunneling microscopes with correction for coupling effects
DIGITAL INSTR INC46 citations93
US4889988ADec 26, 1989
Feedback control for scanning tunnel microscopes
DIGITAL INSTR INC49 citations93
US4871938AOct 3, 1989
Positioning device for a scanning tunneling microscope
DIGITAL INSTR INC52 citations93
US5189906AMar 2, 1993
Compact atomic force microscope
DIGITAL INSTR INC44 citations92
US5237859AAug 24, 1993
Atomic force microscope
DIGITAL INSTR INC38 citations91
USRE37203EJun 5, 2001
Feedback control for scanning tunnel microscopes
DIGITAL INSTR INC7 citations74