Inventor

DU-NOUR OFER

IL7 patents

⚠️ This page may combine multiple inventors who share the name “DU-NOUR OFER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEVET PROCESS CONTROL TECHNOLO

4 patents

US6885467B2Apr 26, 2005

Method and apparatus for thickness decomposition of complicated layer structures

TEVET PROCESS CONTROL TECHNOLO75 citations95

US6678055B2Jan 13, 2004

Method and apparatus for measuring stress in semiconductor wafers

TEVET PROCESS CONTROL TECHNOLO139 citations95

US6801321B1Oct 5, 2004

Method and apparatus for measuring lateral variations in thickness or refractive index of a transparent film on a substrate

TEVET PROCESS CONTROL TECHNOLO69 citations94

US6762838B2Jul 13, 2004

Method and apparatus for production line screening

TEVET PROCESS CONTROL TECHNOLO57 citations94

NANOMETRICS INC

2 patents

US7469164B2Dec 23, 2008

Method and apparatus for process control with in-die metrology

NANOMETRICS INC98 citations96

US7492467B1Feb 17, 2009

Method and apparatus for measuring thickness and optical properties of a thin-film on a substrate

NANOMETRICS INC6 citations61

BACTUSENSE TECH LTD

1 patent

US10656085B2May 19, 2020

High sensitivity real-time bacterial monitor

BACTUSENSE TECH LTD0 citations43