Inventor

YASUTA KATSUO

JP7 patents

⚠️ This page may combine multiple inventors who share the name “YASUTA KATSUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIHON MICRONICS KK

4 patents

US9069008B2Jun 30, 2015

Inspection apparatus for semiconductor devices and chuck stage for the inspection apparatus that is movable with respect to the front and back side electrodes

NIHON MICRONICS KK5 citations66

US7719300B2May 18, 2010

Method for testing a semiconductor wafer and apparatus thereof

NIHON MICRONICS KK3 citations56

US9146256B2Sep 29, 2015

Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling device

NIHON MICRONICS KK1 citations42

US11428727B2Aug 30, 2022

Prober

NIHON MICRONICS KK0 citations39

WASHIO KENICHI

2 patents

US8278965B2Oct 2, 2012

Inspection apparatus

WASHIO KENICHI3 citations51

US8471586B2Jun 25, 2013

Wafer prober for semiconductor inspection and inspection method

WASHIO KENICHI1 citations45

YASUTA KATSUO

1 patent

US9097761B2Aug 4, 2015

Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus

YASUTA KATSUO0 citations31