Inventor

DENGLER Eberhard

DE3 patents

Patents

3 patents

US9977053B2May 22, 2018

Wafer probe alignment

IBM4 citations69

US9927463B2Mar 27, 2018

Wafer probe alignment

IBM2 citations69

US9921268B2Mar 20, 2018

Auto-alignment of backer plate for direct docking test boards

IBM0 citations47