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Inventor
MELLINGER TODD
US
2 patents
Patents
2 patents
US7152192B2
Dec 19, 2006
System and method of testing a plurality of memory blocks of an integrated circuit in parallel
HEWLETT PACKARD DEVELOPMENT CO
11 citations
79
US7284168B2
Oct 16, 2007
Method and system for testing RAM redundant integrated circuits
HEWLETT PACKARD DEVELOPMENT CO
0 citations
31