Inventor
LOUGHMILLER DANIEL R
US43 patents
⚠️ This page may combine multiple inventors who share the name “LOUGHMILLER DANIEL R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
41 patentsUS6438060B1Aug 20, 2002
Method of reducing standby current during power down mode
MICRON TECHNOLOGY INC80 citations98
US5977763ANov 2, 1999
Circuit and method for measuring and forcing an internal voltage of an integrated circuit
MICRON TECHNOLOGY INC101 citations98
US6836437B2Dec 28, 2004
Method of reducing standby current during power down mode
MICRON TECHNOLOGY INC42 citations96
US6396300B1May 28, 2002
Circuit and method for contact pad isolation
MICRON TECHNOLOGY INC52 citations96
US6114878ASep 5, 2000
Circuit for contact pad isolation
MICRON TECHNOLOGY INC48 citations96
US6088282AJul 11, 2000
System and method for an antifuse bank
MICRON TECHNOLOGY INC65 citations96
US5727001AMar 10, 1998
Circuit and method for testing an integrated circuit
MICRON TECHNOLOGY INC33 citations96
US5724282AMar 3, 1998
System and method for an antifuse bank
MICRON TECHNOLOGY INC66 citations96
US6586979B2Jul 1, 2003
Method for noise and power reduction for digital delay lines
MICRON TECHNOLOGY INC52 citations95
US6836419B2Dec 28, 2004
Split word line ternary CAM architecture
MICRON TECHNOLOGY INC34 citations93
US6809974B2Oct 26, 2004
Controller for delay locked loop circuits
MICRON TECHNOLOGY INC18 citations93
US6744654B2Jun 1, 2004
High density dynamic ternary-CAM memory architecture
MICRON TECHNOLOGY INC36 citations93
US6448756B1Sep 10, 2002
Delay line tap setting override for delay locked loop (DLL) testability
MICRON TECHNOLOGY INC36 citations93
US6266794B1Jul 24, 2001
Circuit and method for testing an integrated circuit
MICRON TECHNOLOGY INC18 citations93
US6737897B2May 18, 2004
Power reduction for delay locked loop circuits
MICRON TECHNOLOGY INC34 citations92
US6665219B2Dec 16, 2003
Method of reducing standby current during power down mode
MICRON TECHNOLOGY INC13 citations84
US6229296B1May 8, 2001
Circuit and method for measuring and forcing an internal voltage of an integrated circuit
MICRON TECHNOLOGY INC15 citations84
US5615158AMar 25, 1997
Sense amplifier circuit for detecting degradation of digit lines and method thereof
MICRON TECHNOLOGY INC17 citations82
US7196544B2Mar 27, 2007
Communication device for a logic circuit
MICRON TECHNOLOGY INC7 citations74
US7053650B2May 30, 2006
Communication device for a logic circuit
MICRON TECHNOLOGY INC8 citations74
US6901013B2May 31, 2005
Controller for delay locked loop circuits
MICRON TECHNOLOGY INC10 citations74
US6822475B2Nov 23, 2004
Method for contact pad isolation
MICRON TECHNOLOGY INC5 citations74
US6628144B2Sep 30, 2003
Circuit and method for contact pad isolation
MICRON TECHNOLOGY INC7 citations74
US6564351B2May 13, 2003
Circuit and method for testing an integrated circuit
MICRON TECHNOLOGY INC5 citations74
US6377089B1Apr 23, 2002
Output driver
MICRON TECHNOLOGY INC12 citations74
US6351180B1Feb 26, 2002
Clamp circuit with fuse options
MICRON TECHNOLOGY INC13 citations74
US6140831AOct 31, 2000
Apparatus and methods selectively deriving a boosted voltage exceeding an internal voltage
MICRON TECHNOLOGY INC5 citations74
US6117696ASep 12, 2000
Circuit and method for measuring and forcing an internal voltage of an integrated circuit
MICRON TECHNOLOGY INC7 citations74
US6097223AAug 1, 2000
Drive-current modulated output driver
MICRON TECHNOLOGY INC15 citations74
US5942000AAug 24, 1999
Circuit and method for testing an integrated circuit
MICRON TECHNOLOGY INC4 citations74
US5936908AAug 10, 1999
System and method for an antifuse bank
MICRON TECHNOLOGY INC11 citations74
US5872740AFeb 16, 1999
System and method for an antifuse bank
MICRON TECHNOLOGY INC7 citations74
US5751158AMay 12, 1998
Method and apparatus for selectively deriving a boosted voltage exceeding an internal voltage
MICRON TECHNOLOGY INC9 citations74
US5742549AApr 21, 1998
Sense amplifier circuit for detecting degradation of digit lines and method thereof
MICRON TECHNOLOGY INC12 citations74
US5629843AMay 13, 1997
Self compensating clamp circuit and method for limiting a potential at a pump circuit node
MICRON TECHNOLOGY INC13 citations74
US7468623B2Dec 23, 2008
Clamp circuit with fuse options
MICRON TECHNOLOGY INC2 citations63
US7254753B2Aug 7, 2007
Circuit and method for configuring CAM array margin test and operation
MICRON TECHNOLOGY INC3 citations63
US6946863B1Sep 20, 2005
Circuit and method for measuring and forcing an internal voltage of an integrated circuit
MICRON TECHNOLOGY INC2 citations63
US6885238B2Apr 26, 2005
Clamp circuit with fuse options
MICRON TECHNOLOGY INC2 citations63
US6847534B2Jan 25, 2005
High density dynamic ternary-CAM memory architecture
MICRON TECHNOLOGY INC2 citations63
US12027228B2Jul 2, 2024
Temperature differential-based voltage offset control
MICRON TECHNOLOGY INC0 citations43