Inventor
GOLDMAN RAN
IL4 patents
Patents
4 patentsUS10354376B2Jul 16, 2019
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD5 citations80
US9530199B1Dec 27, 2016
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD12 citations80
US9916652B2Mar 13, 2018
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD2 citations69
US9824852B2Nov 21, 2017
CD-SEM technique for wafers fabrication control
APPLIED MATERIALS ISRAEL LTD0 citations43