Inventor
RATHORE DHANANJAY SINGH
US4 patents
Patents
4 patentsUS10354376B2Jul 16, 2019
Technique for measuring overlay between layers of a multilayer structure
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US9530199B1Dec 27, 2016
Technique for measuring overlay between layers of a multilayer structure
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US9916652B2Mar 13, 2018
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD2 citations69
US11056404B1Jul 6, 2021
Evaluating a hole formed in an intermediate product
APPLIED MATERIALS ISRAEL LTD1 citations51