Inventor
LEVI SHIMON
IL10 patents
⚠️ This page may combine multiple inventors who share the name “LEVI SHIMON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
9 patentsUS10354376B2Jul 16, 2019
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD5 citations80
US9530199B1Dec 27, 2016
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD12 citations80
US9916652B2Mar 13, 2018
Technique for measuring overlay between layers of a multilayer structure
APPLIED MATERIALS ISRAEL LTD2 citations69
US9165376B2Oct 20, 2015
System, method and computer readable medium for detecting edges of a pattern
APPLIED MATERIALS ISRAEL LTD6 citations66
US7990546B2Aug 2, 2011
High throughput across-wafer-variation mapping
APPLIED MATERIALS ISRAEL LTD6 citations60
US11301983B2Apr 12, 2022
Measuring height difference in patterns on semiconductor wafers
APPLIED MATERIALS ISRAEL LTD0 citations58
US11651509B2May 16, 2023
Method, system and computer program product for 3D-NAND CDSEM metrology
APPLIED MATERIALS ISRAEL LTD0 citations51
US10748272B2Aug 18, 2020
Measuring height difference in patterns on semiconductor wafers
APPLIED MATERIALS ISRAEL LTD0 citations48
US10731979B2Aug 4, 2020
Method for monitoring nanometric structures
APPLIED MATERIALS ISRAEL LTD0 citations40