Inventor

AVERBUJ ROBERTO F

US2 patents

Patents

2 patents

US7184915B2Feb 27, 2007

Tiered built-in self-test (BIST) architecture for testing distributed memory modules

QUALCOMM INC30 citations87

US9116876B2Aug 25, 2015

Programmable built-in-self tester (BIST) in memory controller

QUALCOMM INC1 citations49