Inventor
HAGIOS JOHN F
US5 patents
⚠️ This page may combine multiple inventors who share the name “HAGIOS JOHN F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
4 patentsUS6967557B2Nov 22, 2005
Wafer test space transformer
IBM22 citations89
US6720789B1Apr 13, 2004
Method for wafer test and wafer test system for implementing the method
IBM19 citations83
US7084651B2Aug 1, 2006
Probe card assembly
IBM10 citations71
US7688089B2Mar 30, 2010
Compliant membrane thin film interposer probe for intergrated circuit device testing
IBM6 citations70