Inventor
JANG SE-AUG
KR76 patents
⚠️ This page may combine multiple inventors who share the name “JANG SE-AUG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HYNIX SEMICONDUCTOR INC
28 patentsUS6506676B2Jan 14, 2003
Method of manufacturing semiconductor devices with titanium aluminum nitride work function
HYNIX SEMICONDUCTOR INC98 citations98
US6586288B2Jul 1, 2003
Method of forming dual-metal gates in semiconductor device
HYNIX SEMICONDUCTOR INC119 citations97
US6537901B2Mar 25, 2003
Method of manufacturing a transistor in a semiconductor device
HYNIX SEMICONDUCTOR INC146 citations97
US7713823B2May 11, 2010
Semiconductor device with vertical channel transistor and method for fabricating the same
HYNIX SEMICONDUCTOR INC33 citations93
US7682911B2Mar 23, 2010
Semiconductor device having a fin transistor and method for fabricating the same
HYNIX SEMICONDUCTOR INC43 citations93
US7217624B2May 15, 2007
Non-volatile memory device with conductive sidewall spacer and method for fabricating the same
HYNIX SEMICONDUCTOR INC16 citations93
US6451639B1Sep 17, 2002
Method for forming a gate in a semiconductor device
HYNIX SEMICONDUCTOR INC27 citations93
US6436775B2Aug 20, 2002
MOSFET device fabrication method capable of allowing application of self-aligned contact process while maintaining metal gate to have uniform thickness
HYNIX SEMICONDUCTOR INC22 citations93
US6417055B2Jul 9, 2002
Method for forming gate electrode for a semiconductor device
HYNIX SEMICONDUCTOR INC30 citations93
US7045846B2May 16, 2006
Memory device and method for fabricating the same
HYNIX SEMICONDUCTOR INC17 citations92
US7029999B2Apr 18, 2006
Method for fabricating transistor with polymetal gate electrode
HYNIX SEMICONDUCTOR INC30 citations92
US6514827B2Feb 4, 2003
Method for fabricating a dual metal gate for a semiconductor device
HYNIX SEMICONDUCTOR INC38 citations92
US7112486B2Sep 26, 2006
Method for fabricating semiconductor device by using radical oxidation
HYNIX SEMICONDUCTOR INC47 citations91
US7915108B2Mar 29, 2011
Method for fabricating a semiconductor device with a FinFET
HYNIX SEMICONDUCTOR INC8 citations84
US7842594B2Nov 30, 2010
Semiconductor device and method for fabricating the same
HYNIX SEMICONDUCTOR INC8 citations84
US7687361B2Mar 30, 2010
Method of fabricating a transistor having a triple channel in a memory device
HYNIX SEMICONDUCTOR INC8 citations84
US6933226B2Aug 23, 2005
Method of forming a metal gate in a semiconductor device
HYNIX SEMICONDUCTOR INC18 citations84
US6664195B2Dec 16, 2003
Method for forming damascene metal gate
HYNIX SEMICONDUCTOR INC13 citations84
US6624065B2Sep 23, 2003
Method of fabricating a semiconductor device using a damascene metal gate
HYNIX SEMICONDUCTOR INC16 citations83
US7074661B2Jul 11, 2006
Method for fabricating semiconductor device with use of partial gate recessing process
HYNIX SEMICONDUCTOR INC10 citations74
US7332755B2Feb 19, 2008
Transistor structure of memory device and method for fabricating the same
HYNIX SEMICONDUCTOR INC5 citations71
US8053841B2Nov 8, 2011
Semiconductor device having a fin transistor
HYNIX SEMICONDUCTOR INC2 citations63
US8048742B2Nov 1, 2011
Transistor including bulb-type recess channel and method for fabricating the same
HYNIX SEMICONDUCTOR INC4 citations63
US7875540B2Jan 25, 2011
Method for manufacturing recess gate in a semiconductor device
HYNIX SEMICONDUCTOR INC2 citations63
US7838364B2Nov 23, 2010
Semiconductor device with bulb-type recessed channel and method for fabricating the same
HYNIX SEMICONDUCTOR INC3 citations63
US7804129B2Sep 28, 2010
Recessed gate electrode MOS transistor and method for fabricating the same
HYNIX SEMICONDUCTOR INC4 citations63
US7776694B2Aug 17, 2010
Method for fabricating a transistor having vertical channel
HYNIX SEMICONDUCTOR INC5 citations63
US7579265B2Aug 25, 2009
Method for manufacturing recess gate in a semiconductor device
HYNIX SEMICONDUCTOR INC2 citations63
HYUNDAI ELECTRONICS IND
14 patentsUS5856230AJan 5, 1999
Method for making field oxide of semiconductor device
HYUNDAI ELECTRONICS IND33 citations93
US6524918B2Feb 25, 2003
Method for manufacturing a gate structure incorporating therein aluminum oxide as a gate dielectric
HYUNDAI ELECTRONICS IND21 citations92
US6579767B2Jun 17, 2003
Method for forming aluminum oxide as a gate dielectric
HYUNDAI ELECTRONICS IND47 citations90
US6468914B1Oct 22, 2002
Method of forming gate electrode in semiconductor device
HYUNDAI ELECTRONICS IND11 citations74
US6303494B1Oct 16, 2001
Method of forming gate electrode in semiconductor device
HYUNDAI ELECTRONICS IND10 citations74
US6284635B1Sep 4, 2001
Method for forming titanium polycide gate
HYUNDAI ELECTRONICS IND13 citations74
US6268272B1Jul 31, 2001
Method of forming gate electrode with titanium polycide
HYUNDAI ELECTRONICS IND14 citations74
US5972779AOct 26, 1999
Method for forming field oxide film of semiconductor device with silicon and nitrogen containing etching residue
HYUNDAI ELECTRONICS IND8 citations74
US5696022ADec 9, 1997
Method for forming field oxide isolation film
HYUNDAI ELECTRONICS IND10 citations74
US6255206B1Jul 3, 2001
Method of forming gate electrode with titanium polycide structure
HYUNDAI ELECTRONICS IND11 citations73
US5985738ANov 16, 1999
Method for forming field oxide of semiconductor device using wet and dry oxidation
HYUNDAI ELECTRONICS IND9 citations73
US5940719AAug 17, 1999
Method for forming element isolating film of semiconductor device
HYUNDAI ELECTRONICS IND10 citations72
US6255173B1Jul 3, 2001
Method of forming gate electrode with titanium polycide structure
HYUNDAI ELECTRONICS IND6 citations63
US6248632B1Jun 19, 2001
Method of forming gate electrode with polycide structure in semiconductor device
HYUNDAI ELECTRONICS IND5 citations63
SK HYNIX INC
5 patentsUS9406678B2Aug 2, 2016
Method and gate structure for threshold voltage modulation in transistors
SK HYNIX INC11 citations84
US9299704B2Mar 29, 2016
Semiconductor device and method for fabricating the same
SK HYNIX INC9 citations84
US9281310B2Mar 8, 2016
Semiconductor device including gate structure for threshold voltage modulation in transistors and method for fabricating the same
SK HYNIX INC8 citations84
US9548304B2Jan 17, 2017
Semiconductor device including gate structure for threshold voltage modulation in transistors and method for fabricating the same
SK HYNIX INC4 citations73
US8962463B2Feb 24, 2015
Semiconductor device with dual work function gate stacks and method for fabricating the same
SK HYNIX INC3 citations63
SUNG MIN-GYU
1 patentHWANG SUN-HWAN
1 patentHYUNDAI ELECTRONICS IND CO INC
1 patentShowing the top 50 of 76 patents by PatentIndex Score.