P

Inventor

HOURANI RAMI

US58 patents
⚠️ This page may combine multiple inventors who share the name “HOURANI RAMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

37 patents
US10269623B2Apr 23, 2019

Image tone-reversal with a dielectric using bottom-up cross-linking for back end of line (BEOL) interconnects

INTEL CORP10 citations84
US9899255B2Feb 20, 2018

Via blocking layer

INTEL CORP8 citations84
US9530733B2Dec 27, 2016

Forming layers of materials over small regions by selective chemical reaction including limiting enchroachment of the layers over adjacent regions

INTEL CORP8 citations84
US11011463B2May 18, 2021

Dielectric helmet-based approaches for back end of line (BEOL) interconnect fabrication and structures resulting therefrom

INTEL CORP3 citations73
US10615117B2Apr 7, 2020

Self-aligned via

INTEL CORP4 citations73
US10497613B2Dec 3, 2019

Microelectronic conductive routes and methods of making the same

INTEL CORP5 citations73
US10243080B2Mar 26, 2019

Selective deposition utilizing sacrificial blocking layers for semiconductor devices

INTEL CORP3 citations73
US11137681B2Oct 5, 2021

Lined photobucket structure for back end of line (BEOL) interconnect formation

INTEL CORP2 citations72
US10971600B2Apr 6, 2021

Selective gate spacers for semiconductor devices

INTEL CORP1 citations72
US10396176B2Aug 27, 2019

Selective gate spacers for semiconductor devices

INTEL CORP3 citations72
US10366950B2Jul 30, 2019

Bottom-up selective dielectric cross-linking to prevent via landing shorts

INTEL CORP5 citations72
US10109583B2Oct 23, 2018

Method for creating alternate hardmask cap interconnect structure with increased overlay margin

INTEL CORP4 citations72
US11869889B2Jan 9, 2024

Self-aligned gate endcap (SAGE) architectures without fin end gap

INTEL CORP4 citations71
US9418888B2Aug 16, 2016

Non-lithographically patterned directed self assembly alignment promotion layers

INTEL CORP2 citations63
US12341061B2Jun 24, 2025

Bottom-up fill dielectric materials for semiconductor structure fabrication and their methods of fabrication

INTEL CORP0 citations62
US12080639B2Sep 3, 2024

Contact over active gate structures with metal oxide layers to inhibit shorting

INTEL CORP1 citations62
US11990403B2May 21, 2024

Dielectric helmet-based approaches for back end of line (BEOL) interconnect fabrication and structures resulting therefrom

INTEL CORP0 citations62
US11955377B2Apr 9, 2024

Differential hardmasks for modulation of electrobucket sensitivity

INTEL CORP0 citations62
US11894270B2Feb 6, 2024

Grating replication using helmets and topographically-selective deposition

INTEL CORP0 citations62
US11616060B2Mar 28, 2023

Techniques for forming gate structures for transistors arranged in a stacked configuration on a single fin structure

INTEL CORP0 citations62
US11532724B2Dec 20, 2022

Selective gate spacers for semiconductor devices

INTEL CORP0 citations62
US11335598B2May 17, 2022

Grating replication using helmets and topographically-selective deposition

INTEL CORP0 citations62
US11251072B2Feb 15, 2022

Differential hardmasks for modulation of electrobucket sensitivity

INTEL CORP0 citations62
US11232980B2Jan 25, 2022

Bottom-up fill dielectric materials for semiconductor structure fabrication and their methods of fabrication

INTEL CORP1 citations62
US10892184B2Jan 12, 2021

Photobucket floor colors with selective grafting

INTEL CORP0 citations62
US10886175B2Jan 5, 2021

Differentiated molecular domains for selective hardmask fabrication and structures resulting therefrom

INTEL CORP0 citations62
US11953826B2Apr 9, 2024

Lined photobucket structure for back end of line (BEOL) interconnect formation

INTEL CORP0 citations61
US11398428B2Jul 26, 2022

Multifunctional molecules for selective polymer formation on conductive surfaces and structures resulting therefrom

INTEL CORP0 citations61
US12087836B2Sep 10, 2024

Contact over active gate structures with metal oxide-caped contacts to inhibit shorting

INTEL CORP0 citations60
US11837644B2Dec 5, 2023

Contact over active gate structures with metal oxide-caped contacts to inhibit shorting

INTEL CORP0 citations60
US11456248B2Sep 27, 2022

Etch stop layer-based approaches for conductive via fabrication and structures resulting therefrom

INTEL CORP0 citations59
US11417567B2Aug 16, 2022

Conductive cap-based approaches for conductive via fabrication and structures resulting therefrom

INTEL CORP0 citations52
US11404482B2Aug 2, 2022

Self-aligned repeatedly stackable 3D vertical RRAM

INTEL CORP0 citations52
US11139401B2Oct 5, 2021

Vertical thin film transistor structures with localized gate dielectric

INTEL CORP0 citations52
US10756215B2Aug 25, 2020

Selective deposition utilizing sacrificial blocking layers for semiconductor devices

INTEL CORP0 citations52
US10672650B2Jun 2, 2020

Via blocking layer

INTEL CORP0 citations52
US10535601B2Jan 14, 2020

Via blocking layer

INTEL CORP0 citations52

APPLIED MATERIALS INC

13 patents
US11892771B2Feb 6, 2024

Methods for increasing the density of high-index nanoimprint lithography films

APPLIED MATERIALS INC2 citations71
US12384185B2Aug 12, 2025

Methods, systems, and apparatus for inkjet printing self-assembled monoloayer (SAM) structures on substrates

APPLIED MATERIALS INC0 citations62
US12109641B2Oct 8, 2024

Optical device having structural and refractive index gradation, and method of fabricating the same

APPLIED MATERIALS INC0 citations62
US12044963B2Jul 23, 2024

High refractive index imprint compositions and materials and processes for making the same

APPLIED MATERIALS INC1 citations62
US12510707B2Dec 30, 2025

Total or local thickness variation for optical devices

APPLIED MATERIALS INC0 citations61
US12353009B2Jul 8, 2025

Total or local thickness variation for optical devices

APPLIED MATERIALS INC0 citations61
US11868043B2Jan 9, 2024

Imprint compositions with passivated nanoparticles and materials and processes for making the same

APPLIED MATERIALS INC0 citations61
US12372792B2Jul 29, 2025

High index edge blackening material

APPLIED MATERIALS INC0 citations60
US12242186B2Mar 4, 2025

Methods for increasing the density of high-index nanoimprint lithography films

APPLIED MATERIALS INC0 citations60
US12121925B2Oct 22, 2024

Edge blackening for optical devices

APPLIED MATERIALS INC0 citations60
US11850621B2Dec 26, 2023

Edge blackening for optical devices

APPLIED MATERIALS INC1 citations60
US12208637B2Jan 28, 2025

Patterning of optical device films via inkjet soluble mask, deposition, and lift-off

APPLIED MATERIALS INC0 citations58
US11976002B2May 7, 2024

Methods for encapsulating silver mirrors on optical structures

APPLIED MATERIALS INC0 citations57

Showing the top 50 of 58 patents by PatentIndex Score.