Inventor
HOURANI RAMI
US58 patents
⚠️ This page may combine multiple inventors who share the name “HOURANI RAMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
37 patentsUS10269623B2Apr 23, 2019
Image tone-reversal with a dielectric using bottom-up cross-linking for back end of line (BEOL) interconnects
INTEL CORP10 citations84
US9899255B2Feb 20, 2018
Via blocking layer
INTEL CORP8 citations84
US9530733B2Dec 27, 2016
Forming layers of materials over small regions by selective chemical reaction including limiting enchroachment of the layers over adjacent regions
INTEL CORP8 citations84
US11011463B2May 18, 2021
Dielectric helmet-based approaches for back end of line (BEOL) interconnect fabrication and structures resulting therefrom
INTEL CORP3 citations73
US10615117B2Apr 7, 2020
Self-aligned via
INTEL CORP4 citations73
US10497613B2Dec 3, 2019
Microelectronic conductive routes and methods of making the same
INTEL CORP5 citations73
US10243080B2Mar 26, 2019
Selective deposition utilizing sacrificial blocking layers for semiconductor devices
INTEL CORP3 citations73
US11137681B2Oct 5, 2021
Lined photobucket structure for back end of line (BEOL) interconnect formation
INTEL CORP2 citations72
US10971600B2Apr 6, 2021
Selective gate spacers for semiconductor devices
INTEL CORP1 citations72
US10396176B2Aug 27, 2019
Selective gate spacers for semiconductor devices
INTEL CORP3 citations72
US10366950B2Jul 30, 2019
Bottom-up selective dielectric cross-linking to prevent via landing shorts
INTEL CORP5 citations72
US10109583B2Oct 23, 2018
Method for creating alternate hardmask cap interconnect structure with increased overlay margin
INTEL CORP4 citations72
US11869889B2Jan 9, 2024
Self-aligned gate endcap (SAGE) architectures without fin end gap
INTEL CORP4 citations71
US9418888B2Aug 16, 2016
Non-lithographically patterned directed self assembly alignment promotion layers
INTEL CORP2 citations63
US12341061B2Jun 24, 2025
Bottom-up fill dielectric materials for semiconductor structure fabrication and their methods of fabrication
INTEL CORP0 citations62
US12080639B2Sep 3, 2024
Contact over active gate structures with metal oxide layers to inhibit shorting
INTEL CORP1 citations62
US11990403B2May 21, 2024
Dielectric helmet-based approaches for back end of line (BEOL) interconnect fabrication and structures resulting therefrom
INTEL CORP0 citations62
US11955377B2Apr 9, 2024
Differential hardmasks for modulation of electrobucket sensitivity
INTEL CORP0 citations62
US11894270B2Feb 6, 2024
Grating replication using helmets and topographically-selective deposition
INTEL CORP0 citations62
US11616060B2Mar 28, 2023
Techniques for forming gate structures for transistors arranged in a stacked configuration on a single fin structure
INTEL CORP0 citations62
US11532724B2Dec 20, 2022
Selective gate spacers for semiconductor devices
INTEL CORP0 citations62
US11335598B2May 17, 2022
Grating replication using helmets and topographically-selective deposition
INTEL CORP0 citations62
US11251072B2Feb 15, 2022
Differential hardmasks for modulation of electrobucket sensitivity
INTEL CORP0 citations62
US11232980B2Jan 25, 2022
Bottom-up fill dielectric materials for semiconductor structure fabrication and their methods of fabrication
INTEL CORP1 citations62
US10892184B2Jan 12, 2021
Photobucket floor colors with selective grafting
INTEL CORP0 citations62
US10886175B2Jan 5, 2021
Differentiated molecular domains for selective hardmask fabrication and structures resulting therefrom
INTEL CORP0 citations62
US11953826B2Apr 9, 2024
Lined photobucket structure for back end of line (BEOL) interconnect formation
INTEL CORP0 citations61
US11398428B2Jul 26, 2022
Multifunctional molecules for selective polymer formation on conductive surfaces and structures resulting therefrom
INTEL CORP0 citations61
US12087836B2Sep 10, 2024
Contact over active gate structures with metal oxide-caped contacts to inhibit shorting
INTEL CORP0 citations60
US11837644B2Dec 5, 2023
Contact over active gate structures with metal oxide-caped contacts to inhibit shorting
INTEL CORP0 citations60
US11456248B2Sep 27, 2022
Etch stop layer-based approaches for conductive via fabrication and structures resulting therefrom
INTEL CORP0 citations59
US11417567B2Aug 16, 2022
Conductive cap-based approaches for conductive via fabrication and structures resulting therefrom
INTEL CORP0 citations52
US11404482B2Aug 2, 2022
Self-aligned repeatedly stackable 3D vertical RRAM
INTEL CORP0 citations52
US11139401B2Oct 5, 2021
Vertical thin film transistor structures with localized gate dielectric
INTEL CORP0 citations52
US10756215B2Aug 25, 2020
Selective deposition utilizing sacrificial blocking layers for semiconductor devices
INTEL CORP0 citations52
US10672650B2Jun 2, 2020
Via blocking layer
INTEL CORP0 citations52
US10535601B2Jan 14, 2020
Via blocking layer
INTEL CORP0 citations52
APPLIED MATERIALS INC
13 patentsUS11892771B2Feb 6, 2024
Methods for increasing the density of high-index nanoimprint lithography films
APPLIED MATERIALS INC2 citations71
US12384185B2Aug 12, 2025
Methods, systems, and apparatus for inkjet printing self-assembled monoloayer (SAM) structures on substrates
APPLIED MATERIALS INC0 citations62
US12109641B2Oct 8, 2024
Optical device having structural and refractive index gradation, and method of fabricating the same
APPLIED MATERIALS INC0 citations62
US12044963B2Jul 23, 2024
High refractive index imprint compositions and materials and processes for making the same
APPLIED MATERIALS INC1 citations62
US12510707B2Dec 30, 2025
Total or local thickness variation for optical devices
APPLIED MATERIALS INC0 citations61
US12353009B2Jul 8, 2025
Total or local thickness variation for optical devices
APPLIED MATERIALS INC0 citations61
US11868043B2Jan 9, 2024
Imprint compositions with passivated nanoparticles and materials and processes for making the same
APPLIED MATERIALS INC0 citations61
US12372792B2Jul 29, 2025
High index edge blackening material
APPLIED MATERIALS INC0 citations60
US12242186B2Mar 4, 2025
Methods for increasing the density of high-index nanoimprint lithography films
APPLIED MATERIALS INC0 citations60
US12121925B2Oct 22, 2024
Edge blackening for optical devices
APPLIED MATERIALS INC0 citations60
US11850621B2Dec 26, 2023
Edge blackening for optical devices
APPLIED MATERIALS INC1 citations60
US12208637B2Jan 28, 2025
Patterning of optical device films via inkjet soluble mask, deposition, and lift-off
APPLIED MATERIALS INC0 citations58
US11976002B2May 7, 2024
Methods for encapsulating silver mirrors on optical structures
APPLIED MATERIALS INC0 citations57
Showing the top 50 of 58 patents by PatentIndex Score.