Inventor

ALANIZ ABEL

US3 patents

⚠️ This page may combine multiple inventors who share the name “ALANIZ ABEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

2 patents

US7895490B2Feb 22, 2011

Method and system for testing an electronic circuit to identify multiple defects

IBM4 citations57

US7873890B2Jan 18, 2011

Techniques for performing a Logic Built-In Self-Test in an integrated circuit device

IBM2 citations54

GASS BENJAMIN ROBERT

1 patent

US8086925B2Dec 27, 2011

Method and system for LBIST testing of an electronic circuit

GASS BENJAMIN ROBERT10 citations74