Inventor
AHN JEONGHO
KR10 patents
⚠️ This page may combine multiple inventors who share the name “AHN JEONGHO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
8 patentsUS10136286B2Nov 20, 2018
Method for controlling external electronic device and electronic device for processing same
SAMSUNG ELECTRONICS CO LTD6 citations71
US10067067B2Sep 4, 2018
Substrate inspection apparatus
SAMSUNG ELECTRONICS CO LTD4 citations66
US10393672B2Aug 27, 2019
System and method of inspecting substrate and method of fabricating semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD2 citations64
US12130242B2Oct 29, 2024
Inspection system of semiconductor wafer and method of driving the same
SAMSUNG ELECTRONICS CO LTD0 citations57
US11754510B2Sep 12, 2023
Inspection system of semiconductor wafer and method of driving the same
SAMSUNG ELECTRONICS CO LTD1 citations57
US12487653B2Dec 2, 2025
Method for controlling electronic devices and electronic device thereof
SAMSUNG ELECTRONICS CO LTD0 citations49
US12436106B2Oct 7, 2025
Apparatus and method for inspecting semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations42
US11678390B2Jun 13, 2023
Electronic device for performing wireless communication and wireless communication method
SAMSUNG ELECTRONICS CO LTD0 citations40