Inventor · disambiguated record
Ahmad Alyamani
Also filed as: ALYAMANI AHMAD A
2 granted patents·19 citations·filing 2005–2005
57Inventor score
Technology areasG01R
Files withLSI LOGIC CORP2
Top patents by PatentIndex Score
2 records- 0186US7206983B2Segmented addressable scan architecture and method for implementing scan-based testing of integrated circuitsLSI LOGIC CORP·Filed 2005·Granted Apr 17, 2007·17 cites·24 claims
- 0254US7328386B2Methods for using checksums in X-tolerant test response compaction in scan-based testing of integrated circuitsLSI LOGIC CORP·Filed 2005·Granted Feb 5, 2008·2 cites·24 claims
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