P

Inventor

BAYER THOMAS

DE77 patents
⚠️ This page may combine multiple inventors who share the name “BAYER THOMAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

28 patents
US5646339AJul 8, 1997

Force microscope and method for measuring atomic forces in multiple directions

IBM57 citations96
US5578745ANov 26, 1996

Calibration standards for profilometers and methods of producing them

IBM63 citations96
US5116462AMay 26, 1992

Method of producing micromechanical sensors for the afm/stm profilometry

IBM65 citations96
US5051379ASep 24, 1991

Method of producing micromechanical sensors for the AFM/STM profilometry and micromechanical AFM/STM sensor head

IBM71 citations96
US4918033AApr 17, 1990

PECVD (plasma enhanced chemical vapor deposition) method for depositing of tungsten or layers containing tungsten by in situ formation of tungsten fluorides

IBM84 citations96
US5282924AFeb 1, 1994

Micromechanical sensor fabrication process

IBM35 citations93
US6218264B1Apr 17, 2001

Method of producing a calibration standard for 2-D and 3-D profilometry in the sub-nanometer range

IBM17 citations92
US6091124AJul 18, 2000

Micromechanical sensor for AFM/STM profilometry

IBM24 citations92
US6028008AFeb 22, 2000

Calibration standard for profilometers and manufacturing procedure

IBM33 citations92
US5960255ASep 28, 1999

Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it

IBM29 citations92
US5817581AOct 6, 1998

Process for the creation of a thermal SiO2 layer with extremely uniform layer thickness

IBM27 citations92
US5665905ASep 9, 1997

Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it

IBM25 citations92
US5534359AJul 9, 1996

Calibration standard for 2-D and 3-D profilometry in the sub-nanometer range and method of producing it

IBM21 citations92
US5382795AJan 17, 1995

Ultrafine silicon tips for AFM/STM profilometry

IBM41 citations92
US5283107AFeb 1, 1994

Modular multilayer interwiring structure

IBM89 citations92
US5242541ASep 7, 1993

Method of producing ultrafine silicon tips for the afm/stm profilometry

IBM39 citations92
US5162133ANov 10, 1992

Process for fabricating silicon carbide films with a predetermined stress

IBM22 citations92
US5935739AAug 10, 1999

Manufacturing method for membrane lithography mask with mask fields

IBM19 citations91
US4871418AOct 3, 1989

Process for fabricating arbitrarily shaped through holes in a component

IBM48 citations91
US4843315AJun 27, 1989

Contact probe arrangement for electrically connecting a test system to the contact pads of a device to be tested

IBM45 citations90
US4598017AJul 1, 1986

Composite magnetic disk with Si and SiC substrate

IBM28 citations90
US5296091AMar 22, 1994

Method of etching substrates having a low thermal conductivity

IBM17 citations80
US6088320AJul 11, 2000

Micro-mechanically fabricated read/write head with a strengthening shell on the tip shaft

IBM10 citations74
US5455419AOct 3, 1995

Micromechanical sensor and sensor fabrication process

IBM15 citations74
US4969415ANov 13, 1990

PECVD (plasma enhanced chemical vapor deposition) method for depositing of tungsten or layers containing tungsten by in situ formation of tungsten fluorides

IBM12 citations74
US6356089B2Mar 12, 2002

Contact probe arrangement

IBM11 citations73
US5304278AApr 19, 1994

Apparatus for plasma or reactive ion etching and method of etching substrates having a low thermal conductivity

IBM8 citations71
US4569743AFeb 11, 1986

Method and apparatus for the selective, self-aligned deposition of metal layers

IBM11 citations71

ALPHA GETRIEBEBAU GMBH

4 patents

BAYER THOMAS

4 patents

SIEMENS AG

3 patents

WITTENSTEIN AG

2 patents

WITTENSTEIN GMBH & CO KG

1 patent

WILHELM THOMAS

1 patent

ZEISS CARL SMT GMBH

1 patent

SIEMENS AXIVA GMBH & CO KG

1 patent

NOVO NORDISK AS

1 patent

SCHMIDT MICHAEL

1 patent

KOMLOS CHAGAI

1 patent

HOECHST AG

1 patent

WITTENSTEIN SE

1 patent

Showing the top 50 of 77 patents by PatentIndex Score.