Inventor · disambiguated record
Wei Sun
Also filed as: SUN WEI · SUN WEI WEN · SUN WEI-QI
7 granted patents·4 pending applications·22 citations·filing 2002–2020
76Inventor score
Files withHITACHI HIGH TECH CORP4HONGFUJIN PREC IND SHENZHEN4HON HAI PREC IND CO LTD1OHDE JUNYA1WANG WANG DAH ENTPR CO LTD1
Top patents by PatentIndex Score
11 records- 0187US7990080B2System and method for controlling multiple light sourcesHONGFUJIN PREC IND SHENZHEN·Filed 2008·Granted Aug 2, 2011·18 cites·10 claims
- 0276US12176181B2Pattern inspecting deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 24, 2024·1 cites·16 claims
- 0373US10692693B2System and method for measuring patternsHITACHI HIGH TECH CORP·Filed 2018·Granted Jun 23, 2020·1 cites·15 claims
- 0462US8509602B2Recording control apparatus and method, and programOHDE JUNYA·Filed 2005·Granted Aug 13, 2013·2 cites·14 claims
- 0545US7760211B2System and method for light controlHONGFUJIN PREC IND SHENZHEN·Filed 2006·Granted Jul 20, 2010·0 cites·10 claims
- 0644US2009161671A1System and method for driving a step motorHONGFUJIN PREC IND SHENZHEN·Filed 2008·Application pending·0 cites
- 0743US2008042977A1System and method for controlling device operations with a joystickHON HAI PREC IND CO LTD·Filed 2007·Application pending·0 cites
- 0843US2022230842A1Pattern measurement system and pattern measurement methodHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 0941US11355304B2Electronic microscope deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jun 7, 2022·0 cites·15 claims
- 1040US7904272B2System and method for calculating coordinate values of a measuring machineHONGFUJIN PREC IND SHENZHEN·Filed 2008·Granted Mar 8, 2011·0 cites·9 claims
- 1129US2004096079A1Fastening device for earphoneWANG WANG DAH ENTPR CO LTD·Filed 2002·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →