Inventor · disambiguated record
Paiboon Tangyunyong
Also filed as: TANGYUNYONG PAIBOON
7 granted patents·289 citations·filing 1996–2016
87Inventor score
Files withSANDIA CORP4ADVANCED MICRO DEVICES INC1NAT TECH & ENG SOLUTIONS SANDIA LLC1TANGYUNYONG PAIBOON1
Top patents by PatentIndex Score
7 records- 0197US6549022B1Apparatus and method for analyzing functional failures in integrated circuitsSANDIA CORP·Filed 2000·Granted Apr 15, 2003·187 cites·55 claims
- 0295US10094874B1Scanning method for screening of electronic devicesSANDIA CORP·Filed 2016·Granted Oct 9, 2018·15 cites·20 claims
- 0393US10145894B1Defect screening method for electronic circuits and circuit components using power spectrum anaylysisNAT TECH & ENG SOLUTIONS SANDIA LLC·Filed 2015·Granted Dec 4, 2018·9 cites·18 claims
- 0482US7525325B1System and method for floating-substrate passive voltage contrastSANDIA CORP·Filed 2006·Granted Apr 28, 2009·16 cites·28 claims
- 0580US9188622B1Power spectrum analysis for defect screening in integrated circuit devicesTANGYUNYONG PAIBOON·Filed 2011·Granted Nov 17, 2015·6 cites·18 claims
- 0670US5705821AScanning fluorescent microthermal imaging apparatus and methodSANDIA CORP·Filed 1996·Granted Jan 6, 1998·45 cites·29 claims
- 0764US6546513B1Data processing device test apparatus and method thereforADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 8, 2003·11 cites·26 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →