Inventor · disambiguated record
Yi-Chiuen Hu
Also filed as: HU YI · HU YI-CHIUEN
4 granted patents·7 pending applications·137 citations·filing 2004–2022
77Inventor score
Files withPREC INSTR DEV CT3INSTR TECHNOLOGY RES CT2HU YI-CHIUEN1KAO JIANN-SHIUN1NAT APPLIED RES LABORATORIES1
Top patents by PatentIndex Score
11 records- 0191US7189359B2Electrowetting electrode device with electromagnetic field for actuation of magnetic-bead biochemical detection systemPREC INSTR DEV CT OF NAT SCIEN·Filed 2004·Granted Mar 13, 2007·114 cites·10 claims
- 0288US7149395B1Light-enhancing component and fabrication method thereofNAT APPLIED RES LABORATORIES·Filed 2005·Granted Dec 12, 2006·16 cites·19 claims
- 0363US7319284B2Surface acoustic wave device and method for fabricating the samePREC INSTR DEV CT NAT APPLIED·Filed 2005·Granted Jan 15, 2008·5 cites·3 claims
- 0460US2025096257A1Positive electrode active materials, batteries and methods of preparing sameSUNWODA MOBILITY ENERGY TECHNOLOGY CO LTD·Filed 2022·Application pending·0 cites
- 0556US8028389B2Method for fabricating a surface acoustic wave devicePREC INSTR DEV CT·Filed 2007·Granted Oct 4, 2011·2 cites·8 claims
- 0645US2008107826A1Method and apparatus for fabricating nanostructure multi-element compoundINSTR TECHNOLOGY RES CT·Filed 2005·Application pending·0 cites
- 0745US2005045539A1Control device and method for controlling liquid dropletsPREC INSTR DEV CT·Filed 2004·Application pending·0 cites
- 0843US2005036908A1Biochemical detecting device for magnetic beads and method using the samePREC INSTR DEV CT·Filed 2004·Application pending·0 cites
- 0938US2006092416A1In-situ micro-spectro-sensor for detecting gas leakage from vacuum chamber during plasma-based processKAO JIANN-SHIUN·Filed 2005·Application pending·0 cites
- 1036US2012088696A1Micro electrochemical multiplex real-time pcr platformHU YI-CHIUEN·Filed 2011·Application pending·0 cites
- 1134US2008068718A1Micro-Lens Device And Method For Manufacturing The SameINSTR TECHNOLOGY RES CT·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →