Inventor

GOTSZALK TEODOR

PL2 patents

⚠️ This page may combine multiple inventors who share the name “GOTSZALK TEODOR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HECKER MICHAEL

1 patent

US8056402B2Nov 15, 2011

Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques

HECKER MICHAEL14 citations73

RANGELOW IVO W

1 patent

US8689359B2Apr 1, 2014

Apparatus and method for investigating surface properties of different materials

RANGELOW IVO W3 citations51