Inventor
BAEK JONGHOON
US26 patents
⚠️ This page may combine multiple inventors who share the name “BAEK JONGHOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
12 patentsUS9384997B2Jul 5, 2016
Dry-etch selectivity
APPLIED MATERIALS INC146 citations99
US9373517B2Jun 21, 2016
Semiconductor processing with DC assisted RF power for improved control
APPLIED MATERIALS INC137 citations99
US8969212B2Mar 3, 2015
Dry-etch selectivity
APPLIED MATERIALS INC184 citations99
US10032606B2Jul 24, 2018
Semiconductor processing with DC assisted RF power for improved control
APPLIED MATERIALS INC94 citations98
US9593421B2Mar 14, 2017
Particle generation suppressor by DC bias modulation
APPLIED MATERIALS INC63 citations98
US9892888B2Feb 13, 2018
Particle generation suppresor by DC bias modulation
APPLIED MATERIALS INC26 citations94
US10504697B2Dec 10, 2019
Particle generation suppresor by DC bias modulation
APPLIED MATERIALS INC8 citations84
US11339475B2May 24, 2022
Film stack overlay improvement
APPLIED MATERIALS INC2 citations70
US12531206B2Jan 20, 2026
Electrostatic chuck with multiple radio frequency meshes to control plasma uniformity
APPLIED MATERIALS INC0 citations62
US12136536B2Nov 5, 2024
Electrostatic chuck with multiple radio frequency meshes to control plasma uniformity
APPLIED MATERIALS INC0 citations62
US11908662B2Feb 20, 2024
Device and method for tuning plasma distribution using phase control
APPLIED MATERIALS INC0 citations62
US9827578B2Nov 28, 2017
Tightly fitted ceramic insulator on large area electrode
APPLIED MATERIALS INC0 citations51
ASML NETHERLANDS BV
6 patentsUS9888554B2Feb 6, 2018
System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector
ASML NETHERLANDS BV9 citations80
US11347154B2May 31, 2022
Cleaning a structure surface in an EUV chamber
ASML NETHERLANDS BV3 citations70
US10362664B2Jul 23, 2019
System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector
ASML NETHERLANDS BV2 citations69
US12189313B2Jan 7, 2025
Cleaning a structure surface in an EUV chamber
ASML NETHERLANDS BV0 citations59
US11013096B2May 18, 2021
System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector
ASML NETHERLANDS BV0 citations59
US10477662B2Nov 12, 2019
System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector
ASML NETHERLANDS BV0 citations48
BAEK JONGHOON
4 patentsUS8312839B2Nov 20, 2012
Mixing frequency at multiple feeding points
BAEK JONGHOON159 citations98
US9039864B2May 26, 2015
Off-center ground return for RF-powered showerhead
BAEK JONGHOON9 citations82
US9850576B2Dec 26, 2017
Anti-arc zero field plate
BAEK JONGHOON0 citations51
US8875657B2Nov 4, 2014
Balancing RF bridge assembly
BAEK JONGHOON1 citations51
SAMSUNG ELECTRONICS CO LTD
3 patentsUS11264482B2Mar 1, 2022
Semiconductor device including dummy gate patterns and manufacturing method thereof
SAMSUNG ELECTRONICS CO LTD1 citations53
US12563784B2Feb 24, 2026
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations51
US12432972B2Sep 30, 2025
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations46